基于最小割集的系统故障发生概率评估

T. Kohda, K. Inoue
{"title":"基于最小割集的系统故障发生概率评估","authors":"T. Kohda, K. Inoue","doi":"10.1109/RAMS.2002.981640","DOIUrl":null,"url":null,"abstract":"A minimal cut set (MCS) of FTA (fault tree analysis) shows a minimal combination of component failures leading to system failure, based on which system failure probability can be evaluated. However, the conventional inclusion-exclusion method based on MCSs does not necessarily give the system failure occurrence probability. This paper proposes an analytical probability evaluation method of system failure occurrence based on critical states for each basic event. System failure occurrence is caused by a basic event if it occurs at its critical state. Critical states for a basic event can be obtained using logical expression in terms of MCS's. Thus, the system failure occurrence probability can be obtained as the sum of system failure occurrence probabilities caused by basic events. The proposed method assumes any general distribution for component failure probability. An illustrative example shows the details and merits of the method.","PeriodicalId":395613,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Probability evaluation of system-failure occurrence based on minimal cut-sets\",\"authors\":\"T. Kohda, K. Inoue\",\"doi\":\"10.1109/RAMS.2002.981640\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A minimal cut set (MCS) of FTA (fault tree analysis) shows a minimal combination of component failures leading to system failure, based on which system failure probability can be evaluated. However, the conventional inclusion-exclusion method based on MCSs does not necessarily give the system failure occurrence probability. This paper proposes an analytical probability evaluation method of system failure occurrence based on critical states for each basic event. System failure occurrence is caused by a basic event if it occurs at its critical state. Critical states for a basic event can be obtained using logical expression in terms of MCS's. Thus, the system failure occurrence probability can be obtained as the sum of system failure occurrence probabilities caused by basic events. The proposed method assumes any general distribution for component failure probability. An illustrative example shows the details and merits of the method.\",\"PeriodicalId\":395613,\"journal\":{\"name\":\"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAMS.2002.981640\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.2002.981640","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

故障树分析的最小割集(MCS)显示了导致系统故障的部件故障的最小组合,基于此可以评估系统故障概率。然而,传统的基于mcs的包含-排除方法并不一定能给出系统故障发生的概率。提出了一种基于各基本事件临界状态的系统故障发生概率分析评估方法。系统故障的发生是由基本事件引起的,如果发生在其临界状态。一个基本事件的临界状态可以用MCS的逻辑表达式来表示。由此可以得到系统故障发生概率为由基本事件引起的系统故障发生概率之和。该方法假定部件失效概率为任意一般分布。一个实例说明了该方法的细节和优点。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Probability evaluation of system-failure occurrence based on minimal cut-sets
A minimal cut set (MCS) of FTA (fault tree analysis) shows a minimal combination of component failures leading to system failure, based on which system failure probability can be evaluated. However, the conventional inclusion-exclusion method based on MCSs does not necessarily give the system failure occurrence probability. This paper proposes an analytical probability evaluation method of system failure occurrence based on critical states for each basic event. System failure occurrence is caused by a basic event if it occurs at its critical state. Critical states for a basic event can be obtained using logical expression in terms of MCS's. Thus, the system failure occurrence probability can be obtained as the sum of system failure occurrence probabilities caused by basic events. The proposed method assumes any general distribution for component failure probability. An illustrative example shows the details and merits of the method.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信