一种用于硬盘研究的新型高分辨率定量磁力显微镜

P. Kappenberger, H. Hug, S. Martin, H. Guntherodt, D. Buchel, J. Ahner, D. Weller
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引用次数: 1

摘要

磁力显微镜(MFM)已成为表征和评估磁性数据存储中读写磁头、写入磁道和材料性能的主要工具。然而,随着存储密度向1 Tbit/in/sup / 2/推进,标准MFM技术面临以下问题,限制了其在成像钻头结构方面的应用:纳米尺度上缺乏横向分辨率和测量灵敏度;将被测信号与杂散场联系起来的困难;以及分离地形和磁信号的能力。为了获得高横向分辨率,并实现地形和磁性的完全分离,我们开发了用于基础研究的复杂MFMs。由于其复杂性和样本量的限制,这些仪器不适合工业应用。为了克服这些限制,一种新型的室温MFM (QMFM),重点是工业标准应用,已经在大学开发。巴塞尔协议。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A novel high resolution quantitative magnetic force microscope for hard disk research
The Magnetic Force Microscope (MFM) has become a major tool for characterizing and evaluating read and write heads, written tracks and material performance in magnetic data storage. However, standard MFM techniques suffer from the following problems that limit their application to image the bit structure as the storage density advances towards 1 Tbit/in/sup 2/: the lack of lateral resolution and measurement sensitivity on a nanometer scale; the difficulty of relating the measured signal to the stray field; and the ability to separate the topography and magnetic signal. The techniques to obtain a high lateral resolution and achieve a complete separation of topography and magnetism, were developed with sophisticated MFMs built for fundamental research. These instruments are not suitable for industrial applications due to their complexity and restrictions regarding the sample size. In order to overcome these limitations a novel room temperature MFM (QMFM), with a focus on industrial standard applications, has been developed at the University of. Basel.
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