LSSD的改进，减少了测试模式生成的工作量，增加了故障覆盖率

19th Design Automation Conference Pub Date : 1900-01-01 DOI:10.1145/800263.809249

K. Saluja

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引用次数: 5

摘要

本文提出了可用于电平敏感扫描设计的锁存器设计。这些新设计可以使用现有的软件支持设计规则检查，但结果是减少了测试模式生成的工作量，并提供了更好的故障覆盖。本文提出的锁存器的使用不会降低系统的性能。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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An Enhancement of LSSD to Reduce Test Pattern Generation Effort and Increase Fault Coverage

In this paper we propose designs of latches which can be used in Level Sensitive Scan Design NLSSD). These new designs can use the existing software support for design rule checks but result into a reduction of effort in test pattern generation and provide a better fault coverage. The system performance is not degraded with the use of latches proposed in this paper.

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来源期刊

19th Design Automation Conference

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