电介质光谱数据质量的评价

2016 14th International Baltic Conference on Atomic Layer Deposition (BALD) Pub Date : 2016-10-01 DOI:10.1109/BALD.2016.7886537

A. G. Karpov, V. A. Klemeshev

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引用次数: 0

摘要

介电光谱数据包含了材料的结构和内部键及其功能特性的信息。由于介电光谱的原理，这种测量需要相当复杂的处理算法。

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Evaluation of the quality of the dielectric spectroscopy data

The dielectric spectroscopy data contains information on both the structure and internal bonds of the material and its functional properties. Due to the principles of dielectric spectroscopy, such measurements require rather complex processing algorithms.

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2016 14th International Baltic Conference on Atomic Layer Deposition (BALD)

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