{"title":"用介电谐振器技术测量包铜层板的表面电阻和有效电导率","authors":"J. Krupka","doi":"10.1109/MWSYM.2007.380521","DOIUrl":null,"url":null,"abstract":"Dielectric resonator technique has been proposed for precise measurements of the effective conductivity of the inner and the outer surface of copper cladding of microwave laminates. Experiments have shown that the effective conductivity of the inner metal surface is about 4 times smaller than the effective conductivity of the outer metal surface for copper-cladded RT/Duroid.","PeriodicalId":213749,"journal":{"name":"2007 IEEE/MTT-S International Microwave Symposium","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Measurements of the Surface Resistance and the Effective Conductivity of Copper Cladded Laminates Employing Dielectric Resonator Technique\",\"authors\":\"J. Krupka\",\"doi\":\"10.1109/MWSYM.2007.380521\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Dielectric resonator technique has been proposed for precise measurements of the effective conductivity of the inner and the outer surface of copper cladding of microwave laminates. Experiments have shown that the effective conductivity of the inner metal surface is about 4 times smaller than the effective conductivity of the outer metal surface for copper-cladded RT/Duroid.\",\"PeriodicalId\":213749,\"journal\":{\"name\":\"2007 IEEE/MTT-S International Microwave Symposium\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-06-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE/MTT-S International Microwave Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.2007.380521\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE/MTT-S International Microwave Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.2007.380521","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurements of the Surface Resistance and the Effective Conductivity of Copper Cladded Laminates Employing Dielectric Resonator Technique
Dielectric resonator technique has been proposed for precise measurements of the effective conductivity of the inner and the outer surface of copper cladding of microwave laminates. Experiments have shown that the effective conductivity of the inner metal surface is about 4 times smaller than the effective conductivity of the outer metal surface for copper-cladded RT/Duroid.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
