一种新的双分区扫描体系结构，提高迁移故障覆盖率

14th Asian Test Symposium (ATS'05) Pub Date : 2005-12-18 DOI:10.1109/ATS.2005.82

V. Devanathan

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引用次数: 1

摘要

在极深亚微米时代，高过渡故障覆盖率对于确保低水平的百万分率(DPPM)至关重要。本文分析了双分区网络表在过渡故障测试中的作用，提出了一种新的双分区扫描架构，以提高慢速扫描下的过渡故障覆盖率。在5种工业专用集成电路设计上的实验表明，转换故障覆盖率一致增加。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Novel Bi-partitioned Scan Architecture to Improve Transition Fault Coverage

In very deep submicron era, high transition fault coverage is crucial to ensure low levels of Defective Parts Per Million(DPPM). In this paper, the role of bi-partitioning a netlist for transition fault test is analyzed and novel bi-partitioned scan architectures are proposed to improve transition fault coverage with slow speed scan enable. Experiments on 5 industrial ASIC designs show a consistent increase in transition fault coverage.

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14th Asian Test Symposium (ATS'05)

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