S. Poblador, M. Acero, M. B. González, F. Campabadal
{"title":"TiN/Ti/HfO2/W器件中具有双极特性的阻性开关","authors":"S. Poblador, M. Acero, M. B. González, F. Campabadal","doi":"10.1109/CDE.2017.7905217","DOIUrl":null,"url":null,"abstract":"In this work, TiN/Ti/HfO2/W devices have been fabricated and their resistive switching (RS) characteristics have been assessed. The analysis of the obtained results indicates an asymmetric bipolar RS behavior with two very well defined resistance states and good reliability in large sequences of DC voltage sweep and pulse-train cycles.","PeriodicalId":421205,"journal":{"name":"2017 Spanish Conference on Electron Devices (CDE)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Resistive switching with bipolar characteristics in TiN/Ti/HfO2/W devices\",\"authors\":\"S. Poblador, M. Acero, M. B. González, F. Campabadal\",\"doi\":\"10.1109/CDE.2017.7905217\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, TiN/Ti/HfO2/W devices have been fabricated and their resistive switching (RS) characteristics have been assessed. The analysis of the obtained results indicates an asymmetric bipolar RS behavior with two very well defined resistance states and good reliability in large sequences of DC voltage sweep and pulse-train cycles.\",\"PeriodicalId\":421205,\"journal\":{\"name\":\"2017 Spanish Conference on Electron Devices (CDE)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 Spanish Conference on Electron Devices (CDE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CDE.2017.7905217\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 Spanish Conference on Electron Devices (CDE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CDE.2017.7905217","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Resistive switching with bipolar characteristics in TiN/Ti/HfO2/W devices
In this work, TiN/Ti/HfO2/W devices have been fabricated and their resistive switching (RS) characteristics have been assessed. The analysis of the obtained results indicates an asymmetric bipolar RS behavior with two very well defined resistance states and good reliability in large sequences of DC voltage sweep and pulse-train cycles.