铁磁性Co83Gd17薄膜中普通霍尔效应的温度依赖性

Shiwei Chen, J. Han, Tao Wang, Dezheng Yang, D. Xue
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引用次数: 0

摘要

系统地研究了厚度为5 ~ 160 nm的铁磁Co83Gd17薄膜的霍尔效应。我们发现普通霍尔系数受厚度和温度的影响很大。当温度从10 K增加到300 K时,当厚度较大,即t = 160 nm时,普通霍尔系数的值始终为正,并逐渐增大。然而,对于t = 10 nm的小厚度,在140 K时,普通霍尔系数的值突然从+5.4×10-5变为-2.6×10-3 cm3/C。通过分析Co83Gd17的电阻率随温度的变化,可以用边界散射对非晶膜中载流子和不同优势载流子弛豫速率的影响来解释普通霍尔效应与厚度的关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Temperature dependence of the ordinary Hall effect in ferrimagnetic Co83Gd17 thin films
We systematically study the Hall effects of ferrimagnetic Co83Gd17 thin films with the thicknesses t from 5 to 160 nm. We find that the ordinary Hall coefficient is significantly affected by thickness and temperature. With increasing temperature from 10 to 300 K, for large thickness i.e. t = 160 nm the value of ordinary Hall coefficient is always positive and gradually increases. However, for small thickness i.e. t = 10 nm the value of ordinaiy Hall coefficient is suddenly changed sign from +5.4×10-5 to -2.6×10-3 cm3/C at 140 K By analyzing the resistivity of Co83Gd17 as a function of temperature, the ordinary Hall Effect with respect to the thickness can be explained by the influence of boundary scattering on the relaxation rate of carriers and different dominant carriers with the changing temperature in the amorphous films.
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