{"title":"结隔离在单片集成光电子电路光检测中的最佳应用","authors":"K. Berchtold, S. Dermitzakis, J. Suri","doi":"10.1109/esscirc.1976.5469238","DOIUrl":null,"url":null,"abstract":"The concept of optimal use of junction isolation for photodetection in integrated circuits containing a detector element and associated amplifier and logic circuits is described.","PeriodicalId":378614,"journal":{"name":"ESSCIRC 76: 2nd European Solid State Circuits Conference","volume":"149 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1976-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Optimal Use of Junction Isolation for Photodetection in Monolithic Integrated Optoelectronic Circuits\",\"authors\":\"K. Berchtold, S. Dermitzakis, J. Suri\",\"doi\":\"10.1109/esscirc.1976.5469238\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The concept of optimal use of junction isolation for photodetection in integrated circuits containing a detector element and associated amplifier and logic circuits is described.\",\"PeriodicalId\":378614,\"journal\":{\"name\":\"ESSCIRC 76: 2nd European Solid State Circuits Conference\",\"volume\":\"149 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1976-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSCIRC 76: 2nd European Solid State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/esscirc.1976.5469238\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC 76: 2nd European Solid State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/esscirc.1976.5469238","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Optimal Use of Junction Isolation for Photodetection in Monolithic Integrated Optoelectronic Circuits
The concept of optimal use of junction isolation for photodetection in integrated circuits containing a detector element and associated amplifier and logic circuits is described.