{"title":"探索在低功耗数字电路中实现负电容隧道场效应管(NC-TFET)的可行性","authors":"S. Guha, Prithviraj Pachal","doi":"10.1109/VLSIDCS53788.2022.9811449","DOIUrl":null,"url":null,"abstract":"This paper attempts to highlight the circuit-level performance of negative-capacitance tunnel FET, when implemented in low-voltage (VDD) digital logic circuits. SILVACO TCAD is used to simulate the device and properly fitted with L-K calculated solution. The voltage amplification effect on the device current characteristics, corresponding to the ferroelectric gate layer has been suitably presented in this paper. Cadence Virtuoso has been utilized to implement various circuit level applications using NCTFET and suitably benchmarked with a conventional reference TFET (R-TFET). This paper presents the significant advantages gained by implementation of NCTFET in low power circuits.","PeriodicalId":307414,"journal":{"name":"2022 IEEE VLSI Device Circuit and System (VLSI DCS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Exploring the Feasibility of Implementing Negative-Capacitance Tunnel-FET (NC-TFET) in Low-Power Digital Circuits\",\"authors\":\"S. Guha, Prithviraj Pachal\",\"doi\":\"10.1109/VLSIDCS53788.2022.9811449\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper attempts to highlight the circuit-level performance of negative-capacitance tunnel FET, when implemented in low-voltage (VDD) digital logic circuits. SILVACO TCAD is used to simulate the device and properly fitted with L-K calculated solution. The voltage amplification effect on the device current characteristics, corresponding to the ferroelectric gate layer has been suitably presented in this paper. Cadence Virtuoso has been utilized to implement various circuit level applications using NCTFET and suitably benchmarked with a conventional reference TFET (R-TFET). This paper presents the significant advantages gained by implementation of NCTFET in low power circuits.\",\"PeriodicalId\":307414,\"journal\":{\"name\":\"2022 IEEE VLSI Device Circuit and System (VLSI DCS)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-02-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE VLSI Device Circuit and System (VLSI DCS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIDCS53788.2022.9811449\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE VLSI Device Circuit and System (VLSI DCS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIDCS53788.2022.9811449","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Exploring the Feasibility of Implementing Negative-Capacitance Tunnel-FET (NC-TFET) in Low-Power Digital Circuits
This paper attempts to highlight the circuit-level performance of negative-capacitance tunnel FET, when implemented in low-voltage (VDD) digital logic circuits. SILVACO TCAD is used to simulate the device and properly fitted with L-K calculated solution. The voltage amplification effect on the device current characteristics, corresponding to the ferroelectric gate layer has been suitably presented in this paper. Cadence Virtuoso has been utilized to implement various circuit level applications using NCTFET and suitably benchmarked with a conventional reference TFET (R-TFET). This paper presents the significant advantages gained by implementation of NCTFET in low power circuits.