低功耗BiCMOS 50 Gbps gm增强双反馈跨阻放大器

Hossein Mohammadnezhad, Alireza Karimi Bidhendi, Michael M. Green, P. Heydari
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引用次数: 11

摘要

提出了一种单通道50 Gbps跨阻放大器(TIA),采用130纳米SiGe BiCMOS工艺。所提出的TIA由gm增强双反馈共基、rc退化共发射器和电感退化发射器-从动器组成。考虑到100 fF光电二极管的输入电容,TIA在大于50 GHz的3db宽带宽上实现了41 dBÍÍ的测量透阻增益和35.4 pA/√Hz的测量RMS输入参考电流噪声谱密度。它在50gbps下实现了一个开放的眼睛,RMS抖动为2.3 ps(包括测试夹具的抖动贡献)。TIA芯片占用1×0.575 mm2(包括焊盘)的芯片面积,在2v电源电压下耗电24mw(即每1gbps小于0.5 mW)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A low-power BiCMOS 50 Gbps Gm-boosted dual-feedback transimpedance amplifier
A single-channel 50 Gbps transimpedance amplifier (TIA) in 130nm SiGe BiCMOS process is presented. The proposed TIA is comprised of a gm-boosted dual-feedback common-base, an RC-degenerated common-emitter and an inductively degenerated emitter-follower. Accounting for 100 fF photodiode's input capacitance, the TIA achieves a measured transimpedance gain of 41 dBÍÍ and a measured RMS input-referred current-noise spectral density of 35.4 pA/√Hz over a wide 3dB-bandwidth greater than 50 GHz. It achieves an open eye at 50 Gbps with an RMS jitter of 2.3 ps (including the jitter contribution of test fixture). The TIA chip occupies 1×0.575 mm2 (including pads) of die area and dissipates 24 mW from a 2 V supply voltage (i.e., less than 0.5 mW per 1 Gbps).
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