{"title":"模拟布局中独立于应用程序的模块生成","authors":"M. Wolf, U. Kleine","doi":"10.1109/EDTC.1997.582437","DOIUrl":null,"url":null,"abstract":"This paper presents a new feature for a module generator environment that performs application independent module description in analog layouts. With the help of a special capacitance sensitivity matrix one module description can be used for different applications.","PeriodicalId":297301,"journal":{"name":"Proceedings European Design and Test Conference. ED & TC 97","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Application independent module generation in analog layouts\",\"authors\":\"M. Wolf, U. Kleine\",\"doi\":\"10.1109/EDTC.1997.582437\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new feature for a module generator environment that performs application independent module description in analog layouts. With the help of a special capacitance sensitivity matrix one module description can be used for different applications.\",\"PeriodicalId\":297301,\"journal\":{\"name\":\"Proceedings European Design and Test Conference. ED & TC 97\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-03-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings European Design and Test Conference. ED & TC 97\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDTC.1997.582437\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings European Design and Test Conference. ED & TC 97","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTC.1997.582437","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Application independent module generation in analog layouts
This paper presents a new feature for a module generator environment that performs application independent module description in analog layouts. With the help of a special capacitance sensitivity matrix one module description can be used for different applications.