一系列电压脉冲对无源元件和晶体管的影响

2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI:10.1109/MWENT55238.2022.9802284

A. Anikin, K. Epifantsev, A. Shemonaev, P. Skorobogatov

{"title":"一系列电压脉冲对无源元件和晶体管的影响","authors":"A. Anikin, K. Epifantsev, A. Shemonaev, P. Skorobogatov","doi":"10.1109/MWENT55238.2022.9802284","DOIUrl":null,"url":null,"abstract":"The results of studies of capacitors and transistors under the influence of single and multiple voltage pulses are presented. It is shown that the impact of multiple electrical interference reduces the durability of the product compared to the impact of a single pulse.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"98 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effect of a Series of Voltage Pulses on Passive Components and Transistors\",\"authors\":\"A. Anikin, K. Epifantsev, A. Shemonaev, P. Skorobogatov\",\"doi\":\"10.1109/MWENT55238.2022.9802284\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The results of studies of capacitors and transistors under the influence of single and multiple voltage pulses are presented. It is shown that the impact of multiple electrical interference reduces the durability of the product compared to the impact of a single pulse.\",\"PeriodicalId\":218866,\"journal\":{\"name\":\"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)\",\"volume\":\"98 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWENT55238.2022.9802284\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWENT55238.2022.9802284","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

介绍了单次和多次电压脉冲作用下电容器和晶体管的研究结果。结果表明，与单一脉冲的影响相比，多重电干扰的影响会降低产品的耐用性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Effect of a Series of Voltage Pulses on Passive Components and Transistors

The results of studies of capacitors and transistors under the influence of single and multiple voltage pulses are presented. It is shown that the impact of multiple electrical interference reduces the durability of the product compared to the impact of a single pulse.

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2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)

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