双极运算放大器输入偏置电压辐射衰减率的实验估计

2019 IEEE 31st International Conference on Microelectronics (MIEL) Pub Date : 2019-09-01 DOI:10.1109/MIEL.2019.8889637

A. Bakerenkov, V. Pershenkov, V. Felitsyn, A. Rodin, V. Telets, V. Belyakov, A. Zhukov, N. Gluhov

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引用次数: 2

摘要

实验估计了双极运算放大器输入偏置电压的辐射衰减率。在高输入偏置电压初始值和温度漂移的器件中观察到高降解率。对所得结果进行了讨论。

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Experimental Estimation of Input Offset Voltage Radiation Degradation Rate in Bipolar Operational Amplifiers

Radiation degradation rate of input offset voltage in bipolar operational amplifiers was estimated experimentally. High degradation rate was observed in devices with high input offset voltage initial values and temperature drifts. Obtained results were discussed.

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来源期刊

2019 IEEE 31st International Conference on Microelectronics (MIEL)

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