{"title":"散装InP中高场载流子输运的蒙特卡罗模型","authors":"A. You, D. Ong","doi":"10.1109/SMELEC.2000.932457","DOIUrl":null,"url":null,"abstract":"A full band Monte Carlo model is developed to simulate high field carrier transport in bulk InP. The realistic energy band structure used in this model is generated from the local empirical pseudopotential method. The simulated steady-state mean drift velocity and mean energy of electrons and holes as a function of electric fields are consistent with previous reported results. In our model, the electron and hole ionization coefficients are fitted to the available experimental data in the electric field range from 400 kV/cm to 900 kV/cm by a 'softer' threshold than the Keldysh model used in other full band Monte Carlo models described in the literature.","PeriodicalId":359114,"journal":{"name":"ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Monte Carlo modeling of high field carrier transport in bulk InP\",\"authors\":\"A. You, D. Ong\",\"doi\":\"10.1109/SMELEC.2000.932457\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A full band Monte Carlo model is developed to simulate high field carrier transport in bulk InP. The realistic energy band structure used in this model is generated from the local empirical pseudopotential method. The simulated steady-state mean drift velocity and mean energy of electrons and holes as a function of electric fields are consistent with previous reported results. In our model, the electron and hole ionization coefficients are fitted to the available experimental data in the electric field range from 400 kV/cm to 900 kV/cm by a 'softer' threshold than the Keldysh model used in other full band Monte Carlo models described in the literature.\",\"PeriodicalId\":359114,\"journal\":{\"name\":\"ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-11-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMELEC.2000.932457\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMELEC.2000.932457","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Monte Carlo modeling of high field carrier transport in bulk InP
A full band Monte Carlo model is developed to simulate high field carrier transport in bulk InP. The realistic energy band structure used in this model is generated from the local empirical pseudopotential method. The simulated steady-state mean drift velocity and mean energy of electrons and holes as a function of electric fields are consistent with previous reported results. In our model, the electron and hole ionization coefficients are fitted to the available experimental data in the electric field range from 400 kV/cm to 900 kV/cm by a 'softer' threshold than the Keldysh model used in other full band Monte Carlo models described in the literature.