{"title":"基于SOC协同验证技术的FPGA功能测试环境中逻辑资源故障的全覆盖定位","authors":"Y. Liao, P. Li, A. Ruan, W. Li, W.C. Li","doi":"10.1109/ASICON.2009.5351202","DOIUrl":null,"url":null,"abstract":"Full coverage location of logic resource faults is vital for FPGA design and fabrication, rather than only detecting whether there are faults or not. Taking advantage of flexibility and observability of software in conjunction with high-speed simulation of hardware, SOC co-verification technology based in-house FPGA functional test environment embedded with an in-house computerized tool, ConPlacement, can locate logic resources automatically, exhaustively and repeatedly. The approach to implement full coverage location of configurable logic block (CLB) faults by the FPGA functional test environment is presented in the paper. Experimental results of XC4010E demonstrate that full coverage location of logic resource faults as well as multi-faults position can be realized.","PeriodicalId":446584,"journal":{"name":"2009 IEEE 8th International Conference on ASIC","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Full coverage location of logic resource faults in A SOC co-verification technology based FPGA functional test environment\",\"authors\":\"Y. Liao, P. Li, A. Ruan, W. Li, W.C. Li\",\"doi\":\"10.1109/ASICON.2009.5351202\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Full coverage location of logic resource faults is vital for FPGA design and fabrication, rather than only detecting whether there are faults or not. Taking advantage of flexibility and observability of software in conjunction with high-speed simulation of hardware, SOC co-verification technology based in-house FPGA functional test environment embedded with an in-house computerized tool, ConPlacement, can locate logic resources automatically, exhaustively and repeatedly. The approach to implement full coverage location of configurable logic block (CLB) faults by the FPGA functional test environment is presented in the paper. Experimental results of XC4010E demonstrate that full coverage location of logic resource faults as well as multi-faults position can be realized.\",\"PeriodicalId\":446584,\"journal\":{\"name\":\"2009 IEEE 8th International Conference on ASIC\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE 8th International Conference on ASIC\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASICON.2009.5351202\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE 8th International Conference on ASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASICON.2009.5351202","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Full coverage location of logic resource faults in A SOC co-verification technology based FPGA functional test environment
Full coverage location of logic resource faults is vital for FPGA design and fabrication, rather than only detecting whether there are faults or not. Taking advantage of flexibility and observability of software in conjunction with high-speed simulation of hardware, SOC co-verification technology based in-house FPGA functional test environment embedded with an in-house computerized tool, ConPlacement, can locate logic resources automatically, exhaustively and repeatedly. The approach to implement full coverage location of configurable logic block (CLB) faults by the FPGA functional test environment is presented in the paper. Experimental results of XC4010E demonstrate that full coverage location of logic resource faults as well as multi-faults position can be realized.