由于振动引起的微动腐蚀,电连接器中的电容积聚

Haoyue Yang, Y. Tong, G. Flowers, Zhongyang Cheng
{"title":"由于振动引起的微动腐蚀,电连接器中的电容积聚","authors":"Haoyue Yang, Y. Tong, G. Flowers, Zhongyang Cheng","doi":"10.1109/HOLM.2016.7780024","DOIUrl":null,"url":null,"abstract":"Fretting degradation is generally recognized as one of the major failure mechanisms for electrical connector systems. The major driver of fretting damage is relative motion at the contact interface, producing material displacement and transfer. For non-precious metal plated contact interfaces, this fretting damage serves to repeatedly expose fresh metal to atmospheric oxidation. The result is a substantial and rapid increase in contact resistance due to a localized buildup of an insulating layer. Relative motion at the contact interface can be induced by thermal expansion/contraction, vibration, or by a combination of the two mechanisms. There has been considerable recent work on this topic, including experimental investigations and model development work. Much of this previous work on fretting degradation has focused on the increase in electrical resistance resulting from the buildup of corrosion products (the insulating layer) in the interface between the blade and the receptacle. However, the physical separation of the blade and receptacle by the corrosion products also produces a capacitance effect that has not been previously explored in detail. The present study seeks to explore this phenomenon and develop an understanding of its significance. An experimental study was performed to investigate the fashion of the capacitance build-up subjected to vibration induced fretting motion. A simple model is also developed which relates the capacitance behavior to connector characteristic, vibration profile and resistance behavior. A series of experiments and simulation studies have been performed to explore the physical behavior of such systems and study the capacitance effects of the insulating layer. Of particular interest is the effect on signal phase and frequency response across the connector interface and how these effects might be employed to monitor the health of connector systems used for communication signals.","PeriodicalId":117231,"journal":{"name":"2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)","volume":"91 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Capacitance build-up in electrical connectors due to vibration induce fretting corrosion\",\"authors\":\"Haoyue Yang, Y. Tong, G. Flowers, Zhongyang Cheng\",\"doi\":\"10.1109/HOLM.2016.7780024\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fretting degradation is generally recognized as one of the major failure mechanisms for electrical connector systems. The major driver of fretting damage is relative motion at the contact interface, producing material displacement and transfer. For non-precious metal plated contact interfaces, this fretting damage serves to repeatedly expose fresh metal to atmospheric oxidation. The result is a substantial and rapid increase in contact resistance due to a localized buildup of an insulating layer. Relative motion at the contact interface can be induced by thermal expansion/contraction, vibration, or by a combination of the two mechanisms. There has been considerable recent work on this topic, including experimental investigations and model development work. Much of this previous work on fretting degradation has focused on the increase in electrical resistance resulting from the buildup of corrosion products (the insulating layer) in the interface between the blade and the receptacle. However, the physical separation of the blade and receptacle by the corrosion products also produces a capacitance effect that has not been previously explored in detail. The present study seeks to explore this phenomenon and develop an understanding of its significance. An experimental study was performed to investigate the fashion of the capacitance build-up subjected to vibration induced fretting motion. A simple model is also developed which relates the capacitance behavior to connector characteristic, vibration profile and resistance behavior. A series of experiments and simulation studies have been performed to explore the physical behavior of such systems and study the capacitance effects of the insulating layer. Of particular interest is the effect on signal phase and frequency response across the connector interface and how these effects might be employed to monitor the health of connector systems used for communication signals.\",\"PeriodicalId\":117231,\"journal\":{\"name\":\"2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)\",\"volume\":\"91 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.2016.7780024\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.2016.7780024","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

摘要

微动退化是电连接器系统的主要失效机制之一。微动损伤的主要驱动因素是接触界面的相对运动,产生材料位移和传递。对于非贵金属电镀的接触界面,这种微动损伤会使新鲜金属反复暴露在大气氧化中。结果是由于绝缘层的局部堆积,接触电阻大量而迅速地增加。接触界面上的相对运动可以由热膨胀/收缩、振动或两种机制的结合引起。最近有相当多的关于这一主题的工作,包括实验调查和模型开发工作。先前关于微动退化的大部分工作都集中在叶片和插座之间的界面中腐蚀产物(绝缘层)的积累导致的电阻增加上。然而,腐蚀产物对叶片和容器的物理分离也会产生电容效应,这在以前没有被详细探讨过。本研究旨在探讨这一现象,并对其意义有所了解。实验研究了受振动诱导的微动运动影响下电容的形成方式。建立了电容特性与连接器特性、振动曲线和电阻特性之间的简单关系模型。通过一系列的实验和仿真研究,探索了这种系统的物理行为,并研究了绝缘层的电容效应。特别令人感兴趣的是对连接器接口上信号相位和频率响应的影响,以及如何利用这些影响来监测用于通信信号的连接器系统的健康状况。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Capacitance build-up in electrical connectors due to vibration induce fretting corrosion
Fretting degradation is generally recognized as one of the major failure mechanisms for electrical connector systems. The major driver of fretting damage is relative motion at the contact interface, producing material displacement and transfer. For non-precious metal plated contact interfaces, this fretting damage serves to repeatedly expose fresh metal to atmospheric oxidation. The result is a substantial and rapid increase in contact resistance due to a localized buildup of an insulating layer. Relative motion at the contact interface can be induced by thermal expansion/contraction, vibration, or by a combination of the two mechanisms. There has been considerable recent work on this topic, including experimental investigations and model development work. Much of this previous work on fretting degradation has focused on the increase in electrical resistance resulting from the buildup of corrosion products (the insulating layer) in the interface between the blade and the receptacle. However, the physical separation of the blade and receptacle by the corrosion products also produces a capacitance effect that has not been previously explored in detail. The present study seeks to explore this phenomenon and develop an understanding of its significance. An experimental study was performed to investigate the fashion of the capacitance build-up subjected to vibration induced fretting motion. A simple model is also developed which relates the capacitance behavior to connector characteristic, vibration profile and resistance behavior. A series of experiments and simulation studies have been performed to explore the physical behavior of such systems and study the capacitance effects of the insulating layer. Of particular interest is the effect on signal phase and frequency response across the connector interface and how these effects might be employed to monitor the health of connector systems used for communication signals.
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