{"title":"不规则和穿孔动力平面短故障的检测","authors":"F. Chao, R. Wu","doi":"10.1109/IEMT.1995.526110","DOIUrl":null,"url":null,"abstract":"The inspection of short fault in the power plane with irregular and perforated shapes is discussed in this study. Finite element method is utilized in calculating the normalized potential distribution of an irregular and perforated plane. Current source is applied on two diagonal corners of the power plane. The desired short fault position is then determined by the intersection of two zero voltage contour lines obtained in two different test setups. The short fault can be determined by as few as four measurements. The current driving points are also utilized as voltage sensing points. Although the accuracy is not as good as internal measurements, it can provide a convenient way for quick estimation.","PeriodicalId":123707,"journal":{"name":"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'","volume":"55 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Inspection of short fault in power-plane with irregular and perforated shapes [MCMs]\",\"authors\":\"F. Chao, R. Wu\",\"doi\":\"10.1109/IEMT.1995.526110\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The inspection of short fault in the power plane with irregular and perforated shapes is discussed in this study. Finite element method is utilized in calculating the normalized potential distribution of an irregular and perforated plane. Current source is applied on two diagonal corners of the power plane. The desired short fault position is then determined by the intersection of two zero voltage contour lines obtained in two different test setups. The short fault can be determined by as few as four measurements. The current driving points are also utilized as voltage sensing points. Although the accuracy is not as good as internal measurements, it can provide a convenient way for quick estimation.\",\"PeriodicalId\":123707,\"journal\":{\"name\":\"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'\",\"volume\":\"55 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1995.526110\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1995.526110","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Inspection of short fault in power-plane with irregular and perforated shapes [MCMs]
The inspection of short fault in the power plane with irregular and perforated shapes is discussed in this study. Finite element method is utilized in calculating the normalized potential distribution of an irregular and perforated plane. Current source is applied on two diagonal corners of the power plane. The desired short fault position is then determined by the intersection of two zero voltage contour lines obtained in two different test setups. The short fault can be determined by as few as four measurements. The current driving points are also utilized as voltage sensing points. Although the accuracy is not as good as internal measurements, it can provide a convenient way for quick estimation.