R. Morohashi, Y. Kasai, Masahiro Uchiyama, T. Kawakami, Y. Yamagata
{"title":"外腔结构对大功率波长稳定激光二极管失效模式的影响","authors":"R. Morohashi, Y. Kasai, Masahiro Uchiyama, T. Kawakami, Y. Yamagata","doi":"10.23919/ISLC52947.2022.9943408","DOIUrl":null,"url":null,"abstract":"Failure mode of high power laser diode under wavelength stabilized operation is investigated. Differences in the external cavity layout is found to affect near-field pattern inhomogeneity which is induced by optical feedback, resulting in a significant impact on the ratio of facet failure.","PeriodicalId":443954,"journal":{"name":"2022 28th International Semiconductor Laser Conference (ISLC)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Influence of External Cavity Configuration on the Failure Mode of High Power Wavelength Stabilized Laser Diode\",\"authors\":\"R. Morohashi, Y. Kasai, Masahiro Uchiyama, T. Kawakami, Y. Yamagata\",\"doi\":\"10.23919/ISLC52947.2022.9943408\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Failure mode of high power laser diode under wavelength stabilized operation is investigated. Differences in the external cavity layout is found to affect near-field pattern inhomogeneity which is induced by optical feedback, resulting in a significant impact on the ratio of facet failure.\",\"PeriodicalId\":443954,\"journal\":{\"name\":\"2022 28th International Semiconductor Laser Conference (ISLC)\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 28th International Semiconductor Laser Conference (ISLC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/ISLC52947.2022.9943408\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 28th International Semiconductor Laser Conference (ISLC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ISLC52947.2022.9943408","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Influence of External Cavity Configuration on the Failure Mode of High Power Wavelength Stabilized Laser Diode
Failure mode of high power laser diode under wavelength stabilized operation is investigated. Differences in the external cavity layout is found to affect near-field pattern inhomogeneity which is induced by optical feedback, resulting in a significant impact on the ratio of facet failure.