{"title":"系统ESD抗扰度通过门阵列设计","authors":"S. Wong","doi":"10.1109/ISEMC.1991.148230","DOIUrl":null,"url":null,"abstract":"A major source of today's electronic system electrostatic discharge (ESD) failure mechanism is the EM field radiation interference from ESD. The conventional ways to harden the system immunity against this electromagnetic interference (EMI) field susceptibility include shielding, ground bonding, noise pickup circuit loop reduction, noise decoupling, and suppression. The case presented involves resolving a desktop computer system ESD susceptibility problem by using circuit design changes to custom gate array ICs to achieve the system ESD immunity.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"System ESD immunity through gate array design\",\"authors\":\"S. Wong\",\"doi\":\"10.1109/ISEMC.1991.148230\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A major source of today's electronic system electrostatic discharge (ESD) failure mechanism is the EM field radiation interference from ESD. The conventional ways to harden the system immunity against this electromagnetic interference (EMI) field susceptibility include shielding, ground bonding, noise pickup circuit loop reduction, noise decoupling, and suppression. The case presented involves resolving a desktop computer system ESD susceptibility problem by using circuit design changes to custom gate array ICs to achieve the system ESD immunity.<<ETX>>\",\"PeriodicalId\":243730,\"journal\":{\"name\":\"IEEE 1991 International Symposium on Electromagnetic Compatibility\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-08-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1991 International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1991.148230\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1991 International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1991.148230","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A major source of today's electronic system electrostatic discharge (ESD) failure mechanism is the EM field radiation interference from ESD. The conventional ways to harden the system immunity against this electromagnetic interference (EMI) field susceptibility include shielding, ground bonding, noise pickup circuit loop reduction, noise decoupling, and suppression. The case presented involves resolving a desktop computer system ESD susceptibility problem by using circuit design changes to custom gate array ICs to achieve the system ESD immunity.<>
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