Zhang Huai, J. Zhibin, Lee Yen-Fei, Ko Chen-Pin, L. Choo Ooi Tuck, Lim Lee Phing
{"title":"半导体晶圆厂动态瓶颈机器调度方法","authors":"Zhang Huai, J. Zhibin, Lee Yen-Fei, Ko Chen-Pin, L. Choo Ooi Tuck, Lim Lee Phing","doi":"10.1109/ISSM.2007.4446814","DOIUrl":null,"url":null,"abstract":"This paper proposed a dynamic bottleneck dispatching (DBD) policy to consider the dynamic bottlenecks for semiconductor wafer fabrication system. The DBD policy adopted the multi-class priority queuing model and developed a procedure to assign lots to different priority classes. Each queuing lot was assigned to a priority class by 3 decision parameters, which could be optimized by the response surface method and a desirability function approach. A case study based on a local fab was described to examine the performance impact of the DBD policy measured by CT, Var CT, WIP, and TP. The results of the simulation experiments and analysis showed that the DBD policy is superior to the use of the static dispatching rules. In future work, the DBD policy could be integrated with manufacturing execution system (MES) for scheduling wafer fab.","PeriodicalId":325607,"journal":{"name":"2007 International Symposium on Semiconductor Manufacturing","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"An approach of dynamic bottleneck machine dispatching for semiconductor wafer fab\",\"authors\":\"Zhang Huai, J. Zhibin, Lee Yen-Fei, Ko Chen-Pin, L. Choo Ooi Tuck, Lim Lee Phing\",\"doi\":\"10.1109/ISSM.2007.4446814\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposed a dynamic bottleneck dispatching (DBD) policy to consider the dynamic bottlenecks for semiconductor wafer fabrication system. The DBD policy adopted the multi-class priority queuing model and developed a procedure to assign lots to different priority classes. Each queuing lot was assigned to a priority class by 3 decision parameters, which could be optimized by the response surface method and a desirability function approach. A case study based on a local fab was described to examine the performance impact of the DBD policy measured by CT, Var CT, WIP, and TP. The results of the simulation experiments and analysis showed that the DBD policy is superior to the use of the static dispatching rules. In future work, the DBD policy could be integrated with manufacturing execution system (MES) for scheduling wafer fab.\",\"PeriodicalId\":325607,\"journal\":{\"name\":\"2007 International Symposium on Semiconductor Manufacturing\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 International Symposium on Semiconductor Manufacturing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSM.2007.4446814\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 International Symposium on Semiconductor Manufacturing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSM.2007.4446814","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An approach of dynamic bottleneck machine dispatching for semiconductor wafer fab
This paper proposed a dynamic bottleneck dispatching (DBD) policy to consider the dynamic bottlenecks for semiconductor wafer fabrication system. The DBD policy adopted the multi-class priority queuing model and developed a procedure to assign lots to different priority classes. Each queuing lot was assigned to a priority class by 3 decision parameters, which could be optimized by the response surface method and a desirability function approach. A case study based on a local fab was described to examine the performance impact of the DBD policy measured by CT, Var CT, WIP, and TP. The results of the simulation experiments and analysis showed that the DBD policy is superior to the use of the static dispatching rules. In future work, the DBD policy could be integrated with manufacturing execution system (MES) for scheduling wafer fab.