{"title":"高速数字系统的竞争技术","authors":"R. Stewart","doi":"10.1109/ISSCC.1987.1157166","DOIUrl":null,"url":null,"abstract":"Several new technologies, including sub-micron CMOS, SOI/ SMOS, BiCMOS GaAs and advanced bipolar ECL, are being developed for the super-fast ULSI digital system of the '90s. . . The panel will discuss whether the continued scaling of bulk CMOS will be adequate or whether a change over to technologies such as SOI or GaAs will be required . . . Meaningful measures for comparing these technologies will also be assessed.","PeriodicalId":102932,"journal":{"name":"1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Competing technologies for high-speed digital systems\",\"authors\":\"R. Stewart\",\"doi\":\"10.1109/ISSCC.1987.1157166\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Several new technologies, including sub-micron CMOS, SOI/ SMOS, BiCMOS GaAs and advanced bipolar ECL, are being developed for the super-fast ULSI digital system of the '90s. . . The panel will discuss whether the continued scaling of bulk CMOS will be adequate or whether a change over to technologies such as SOI or GaAs will be required . . . Meaningful measures for comparing these technologies will also be assessed.\",\"PeriodicalId\":102932,\"journal\":{\"name\":\"1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"59 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1987.1157166\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1987.1157166","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Competing technologies for high-speed digital systems
Several new technologies, including sub-micron CMOS, SOI/ SMOS, BiCMOS GaAs and advanced bipolar ECL, are being developed for the super-fast ULSI digital system of the '90s. . . The panel will discuss whether the continued scaling of bulk CMOS will be adequate or whether a change over to technologies such as SOI or GaAs will be required . . . Meaningful measures for comparing these technologies will also be assessed.