{"title":"用于设计可调谐电路的统计电路模拟器","authors":"K.C. Li, K. So, P.C.K. Liu","doi":"10.1109/TENCON.1993.320218","DOIUrl":null,"url":null,"abstract":"In this paper, a statistical circuit simulator for the selection of tuning components is described. Using this simulator, a circuit designer can make an appropriate solution on the selection of tuning component as well as an estimate of the yield for manufacturing.<<ETX>>","PeriodicalId":110496,"journal":{"name":"Proceedings of TENCON '93. IEEE Region 10 International Conference on Computers, Communications and Automation","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A statistical circuit simulator for designing tunable circuits\",\"authors\":\"K.C. Li, K. So, P.C.K. Liu\",\"doi\":\"10.1109/TENCON.1993.320218\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a statistical circuit simulator for the selection of tuning components is described. Using this simulator, a circuit designer can make an appropriate solution on the selection of tuning component as well as an estimate of the yield for manufacturing.<<ETX>>\",\"PeriodicalId\":110496,\"journal\":{\"name\":\"Proceedings of TENCON '93. IEEE Region 10 International Conference on Computers, Communications and Automation\",\"volume\":\"80 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-10-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of TENCON '93. IEEE Region 10 International Conference on Computers, Communications and Automation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TENCON.1993.320218\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of TENCON '93. IEEE Region 10 International Conference on Computers, Communications and Automation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TENCON.1993.320218","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A statistical circuit simulator for designing tunable circuits
In this paper, a statistical circuit simulator for the selection of tuning components is described. Using this simulator, a circuit designer can make an appropriate solution on the selection of tuning component as well as an estimate of the yield for manufacturing.<>