改进基于uvm的测试生成和覆盖关闭的建议方法

Khaled Fathy, K. Salah, R. Guindi
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引用次数: 3

摘要

验证架构师需要利用System Verilog支持的随机性,并能够定义测试要遵循的通用路径。该路径表示特征的子集,并允许测试随机探索设计空间以深入探索角落。为这样的设计建立一个测试用例需要一个定义良好的刺激生成方法。现成的场景库以及用于并行刺激的同步和调度过程方法需要跨多个测试用例重用。在本文中,我们定义了一种创建测试场景的方法,并利用面向对象的原则来构建具有通用并行刺激同步过程的复合分层场景序列。我们将我们的方法构建为可在许多设计中重用的通用库代码。最近的内存控制器设计用于演示我们的方法。在测试用例上应用这种方法的结果显示了覆盖、关闭和性能的增强。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A proposed methodology to improve UVM-based test generation and coverage closure
Verification architects need to make use of randomness supported by System Verilog and be able to define a generic path for the test to follow. This path represents a subset of features, and allows the test to randomly explore the design space to explore corners in depth. Setting up a test case for such designs requires a well-defined stimulus generation methodology. Off-the-shelf scenario libraries and a synchronization and scheduling process methodology for the parallel stimuli need to be reused across several test cases. In this paper, we define a methodology for creating test scenarios and making use of object oriented principles to build composite layered scenario sequences with a generic parallel stimuli synchronization process. We built our methodology as a generic library code to be reused in many designs. A recent memory controller design is used to demonstrate our methodology. The results of applying this methodology on test cases show enhancements on coverage closure and performance.
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