{"title":"PNP-eSCR ESD保护装置,具有可调触发和保持电压,适用于高压应用","authors":"Da-Wei Lai, S. Zhao, Jian Gao, T. Smedes","doi":"10.1109/EOSESD.2016.7592526","DOIUrl":null,"url":null,"abstract":"A novel ESD device (PNP with embedded SCR), with tunable VT1 and VH, is proposed for high voltage applications. Tuning is achieved through design and process options. The trigger mechanism is determined by the series connection of PNP(s) and diode. The holding voltage is determined by the eSCR and additional PNP(s).","PeriodicalId":239756,"journal":{"name":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"PNP-eSCR ESD protection device with tunable trigger and holding voltage for high voltage applications\",\"authors\":\"Da-Wei Lai, S. Zhao, Jian Gao, T. Smedes\",\"doi\":\"10.1109/EOSESD.2016.7592526\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel ESD device (PNP with embedded SCR), with tunable VT1 and VH, is proposed for high voltage applications. Tuning is achieved through design and process options. The trigger mechanism is determined by the series connection of PNP(s) and diode. The holding voltage is determined by the eSCR and additional PNP(s).\",\"PeriodicalId\":239756,\"journal\":{\"name\":\"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EOSESD.2016.7592526\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2016.7592526","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
PNP-eSCR ESD protection device with tunable trigger and holding voltage for high voltage applications
A novel ESD device (PNP with embedded SCR), with tunable VT1 and VH, is proposed for high voltage applications. Tuning is achieved through design and process options. The trigger mechanism is determined by the series connection of PNP(s) and diode. The holding voltage is determined by the eSCR and additional PNP(s).