{"title":"提出了一种基于锁相环反馈采样的锁相环锁出检测方案","authors":"Muhammad Kalimuddin Khan, K. Mulvaney","doi":"10.1109/CSNDSP.2014.6923960","DOIUrl":null,"url":null,"abstract":"The existing state of the art lock/out-of-lock detection schemes used in PLL (Phase lock loop) suffers from process, voltage and temperature (PVT) variations and has limited accuracy especially in fractional PLL mode of operation. Moreover, the schemes are not suitable to detect both lock and out-of-lock condition accurately. This paper describes a novel mixed signal scheme which incorporates detection of both lock and out-of-lock conditions of a PLL. The scheme covers integer and fractional PLL modes of operations and programmable to generate lock condition to a very high accuracy. Furthermore, this digital detection scheme is not prone to process, voltage and temperature variations.","PeriodicalId":199393,"journal":{"name":"2014 9th International Symposium on Communication Systems, Networks & Digital Sign (CSNDSP)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A novel PLL lock and out-of-lock detect scheme based on a feedback sampling of PLL\",\"authors\":\"Muhammad Kalimuddin Khan, K. Mulvaney\",\"doi\":\"10.1109/CSNDSP.2014.6923960\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The existing state of the art lock/out-of-lock detection schemes used in PLL (Phase lock loop) suffers from process, voltage and temperature (PVT) variations and has limited accuracy especially in fractional PLL mode of operation. Moreover, the schemes are not suitable to detect both lock and out-of-lock condition accurately. This paper describes a novel mixed signal scheme which incorporates detection of both lock and out-of-lock conditions of a PLL. The scheme covers integer and fractional PLL modes of operations and programmable to generate lock condition to a very high accuracy. Furthermore, this digital detection scheme is not prone to process, voltage and temperature variations.\",\"PeriodicalId\":199393,\"journal\":{\"name\":\"2014 9th International Symposium on Communication Systems, Networks & Digital Sign (CSNDSP)\",\"volume\":\"82 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 9th International Symposium on Communication Systems, Networks & Digital Sign (CSNDSP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CSNDSP.2014.6923960\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 9th International Symposium on Communication Systems, Networks & Digital Sign (CSNDSP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSNDSP.2014.6923960","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel PLL lock and out-of-lock detect scheme based on a feedback sampling of PLL
The existing state of the art lock/out-of-lock detection schemes used in PLL (Phase lock loop) suffers from process, voltage and temperature (PVT) variations and has limited accuracy especially in fractional PLL mode of operation. Moreover, the schemes are not suitable to detect both lock and out-of-lock condition accurately. This paper describes a novel mixed signal scheme which incorporates detection of both lock and out-of-lock conditions of a PLL. The scheme covers integer and fractional PLL modes of operations and programmable to generate lock condition to a very high accuracy. Furthermore, this digital detection scheme is not prone to process, voltage and temperature variations.