基于随机和聚类故障注入的多故障仿真

Proceedings of Eighth International Application Specific Integrated Circuits Conference Pub Date : 1995-09-18 DOI:10.1109/ASIC.1995.580718

C. Stroud, C. A. Ryan

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引用次数: 9

摘要

介绍了一种逻辑故障模拟器，既能实现门级多卡滞故障仿真，又能实现传统的单卡滞故障仿真。多故障仿真支持随机和聚类故障注入，用于验证和评估测试向量集的多故障检测能力以及容错和容错设计技术。

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Multiple fault simulation with random and clustered fault injection

A logic and fault simulator is described which provides gate-level multiple stuck-at fault simulation as well as traditional single stuck-at fault simulation. The multiple fault simulation supports random and clustered fault injection for the verification and evaluation of multiple fault detection capabilities of test vector sets as well as fault and defect-tolerant design techniques.

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Proceedings of Eighth International Application Specific Integrated Circuits Conference

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