Memory Retention Life at Various Environmental and Life Tests

The memory retention life and its repeatability was examined under conditions of high temperature storage, temperature cycling, bias operating, and high humidity, and after write/erase cycles for MNMoOS EAROMs having short memory retention life. It is shown that the high temperature storage and humidity tests are representative of all these tests, retention life during humidity tests for PED's is generally shorter than the unrecoverable failure life, and SiN overcoating extends retention life remarkably.