焊接在软电缆上的陶瓷模块的强度和可靠性

N. T. Panousis, J. F. Prosser, A. T. Wang, Y.N. Yong
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引用次数: 3

摘要

讨论了模块引脚与柔性电缆之间焊接连接的强度和可靠性。描述了连接强度的定量测量方法。通过测量将单个引脚推过电缆所需的力,对其进行机械测试,并记录力和失效模式。推通测试用于确定最大初始强度的最佳焊料体积,并测量暴露于环境应力后的退化情况。第一个可靠性测试是在80,100和125摄氏度的恒定高温下储存单元长达8500小时。对这些结果进行了非线性回归模型分析。对于优势模式,该模型的结果为:PS/sub i/(t, t)=3.05-58*exp(-2629/ t)*t/sup 0.38/+ epsilon /sub i/,其中PS(t, t)为推通强度作为时间、t和开尔文温度的函数,t . epsilon /sub i/为随机部分,均值为0,正态分布。这些结果给出了0.6 eV的有效活化能。第二个可靠性测试是在-40到+100摄氏度之间进行1000次热循环。没有退化。一个简单的一阶估计表明,这相当于大约五个生命周期。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Strength and reliability of ceramic modules soldered to flexible cables
The strength and reliability of soldered interconnections between module pins and flexible cables are discussed. A quantitative measure of the strength of the connection is described. Individual pins were mechanically tested by measuring the force required to push them through the cable, and force and failure mode were recorded. The push-through test was used to determine optimum solder volume for maximum initial strength and to measure degradation following exposure to environmental stresses. The first reliability stress was to store units at constant elevated temperature of 80, 100, and 125 degrees C for up to 8500 h. Analysis of these results was done with a nonlinear regression model. For the dominant mode, the results of this model are: PS/sub i/(t,T)=3.05-58*exp(-2629/T)*t/sup 0.38/+ epsilon /sub i/, where PS(t,T) is the push-through strength as a function of time, t, and Kelvin temperature, T. epsilon /sub i/ represents the random part and is distributed normally with 0 mean. These results give an effective activation energy of 0.6 eV. The second reliability test was to thermally cycle units between -40 and +100 degrees C for up to 1000 cycles. There was no degradation. A simple first-order estimate indicates that this is equivalent to about five lifetimes.<>
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CiteScore
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