{"title":"5.25GHz低噪声放大器的新型射频BIST电路设计","authors":"J. Ryu, D. Kadam, T. Alex, B.C. Kim","doi":"10.1109/BIPOL.2004.1365794","DOIUrl":null,"url":null,"abstract":"This paper presents a new low-cost RF Built-In condition will be highly beneficial to rectification of RF signals. Self-Test (BIST) circuit for measuring input impedance, To reduce the output ripple voltage, ROT and C O ~ are chosen with eansducer voltage gain, noise figure, and input return loss of large values. 5.25GHz IOW noise amplifier (LNA). The BIST circuit is ............................................................................................. designed using 0.18pm SiGe technology. The test technique using BIST circuit utilizes input impedance matching and output transient voltage measurements. The technique is simple and inexpensive.","PeriodicalId":447762,"journal":{"name":"Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting","volume":"123 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-12-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Design of a new RF BIST circuit for 5.25GHz low noise amplifiers\",\"authors\":\"J. Ryu, D. Kadam, T. Alex, B.C. Kim\",\"doi\":\"10.1109/BIPOL.2004.1365794\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new low-cost RF Built-In condition will be highly beneficial to rectification of RF signals. Self-Test (BIST) circuit for measuring input impedance, To reduce the output ripple voltage, ROT and C O ~ are chosen with eansducer voltage gain, noise figure, and input return loss of large values. 5.25GHz IOW noise amplifier (LNA). The BIST circuit is ............................................................................................. designed using 0.18pm SiGe technology. The test technique using BIST circuit utilizes input impedance matching and output transient voltage measurements. The technique is simple and inexpensive.\",\"PeriodicalId\":447762,\"journal\":{\"name\":\"Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting\",\"volume\":\"123 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-12-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BIPOL.2004.1365794\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BIPOL.2004.1365794","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of a new RF BIST circuit for 5.25GHz low noise amplifiers
This paper presents a new low-cost RF Built-In condition will be highly beneficial to rectification of RF signals. Self-Test (BIST) circuit for measuring input impedance, To reduce the output ripple voltage, ROT and C O ~ are chosen with eansducer voltage gain, noise figure, and input return loss of large values. 5.25GHz IOW noise amplifier (LNA). The BIST circuit is ............................................................................................. designed using 0.18pm SiGe technology. The test technique using BIST circuit utilizes input impedance matching and output transient voltage measurements. The technique is simple and inexpensive.
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