用于半导体光放大器测量的载流子微波座

2013 SBMO/IEEE MTT-S International Microwave & Optoelectronics Conference (IMOC) Pub Date : 2013-10-28 DOI:10.1109/IMOC.2013.6646415

R. Figueiredo, N. Ribeiro, E. Conforti, C. Gallep

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引用次数: 4

摘要

本文介绍了一种用于芯片测试的微波支架(高达40 GHz)，光纤装置在光学台上。半导体光放大器(SOA)的载波芯片(未封装)的开关时间测试上升时间低于100 ps。它可以用于各种SOA和光电高速应用的光子器件测试。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Chip-on-carrier microwave mount for semiconductor optical amplifier measurements

The present paper describes a microwave mount (up to 40 GHz) with fiber facility inside an optical table for chip tests. Semiconductor optical amplifier (SOA) switching times of a chip-on-carrier (unpackaged) SOA were tested with rise times below 100 ps. It could be useful for a variety of SOA and photonic devices tests for electro-optical high-speed applications.

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来源期刊

2013 SBMO/IEEE MTT-S International Microwave & Optoelectronics Conference (IMOC)

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