高功率和高频应用的高k SOI GaN FinFET

Vandana Singh Rajawat, Bharat Choudhary, Ajay Kumar
{"title":"高功率和高频应用的高k SOI GaN FinFET","authors":"Vandana Singh Rajawat, Bharat Choudhary, Ajay Kumar","doi":"10.1109/EDKCON56221.2022.10032945","DOIUrl":null,"url":null,"abstract":"This paper proposes a 3-D simulation study of high-k SOI GaN FinFET. High ON current, faster- speed, lower subthreshold swing is obtained thus suppressing the short channel effects more effectively. Extremely low OFF current is obtained due to bulk conduction in the GaN channel layer, which can be fully depleted. Various electrical parameters obtained are compared with Bulk GaN FinFET and Conventional FinFET (Si-based). Proposed FinFET is designed by using a metal gate and high-K oxide (HfO2) is used as the gate oxide layer. The proposed High-k SOI GaN FinFET has come out as a very viable option because it is known for high performance and high-speed integrated circuits; and also for high frequency and high power applications due to using high mobility GaN fin instead of silicon fin used in conventional devices.","PeriodicalId":296883,"journal":{"name":"2022 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)","volume":"2871 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High-k SOI GaN FinFET for High Power and High Frequency Applications\",\"authors\":\"Vandana Singh Rajawat, Bharat Choudhary, Ajay Kumar\",\"doi\":\"10.1109/EDKCON56221.2022.10032945\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a 3-D simulation study of high-k SOI GaN FinFET. High ON current, faster- speed, lower subthreshold swing is obtained thus suppressing the short channel effects more effectively. Extremely low OFF current is obtained due to bulk conduction in the GaN channel layer, which can be fully depleted. Various electrical parameters obtained are compared with Bulk GaN FinFET and Conventional FinFET (Si-based). Proposed FinFET is designed by using a metal gate and high-K oxide (HfO2) is used as the gate oxide layer. The proposed High-k SOI GaN FinFET has come out as a very viable option because it is known for high performance and high-speed integrated circuits; and also for high frequency and high power applications due to using high mobility GaN fin instead of silicon fin used in conventional devices.\",\"PeriodicalId\":296883,\"journal\":{\"name\":\"2022 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)\",\"volume\":\"2871 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDKCON56221.2022.10032945\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDKCON56221.2022.10032945","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文提出了高k SOI GaN FinFET的三维仿真研究。高导通电流,更快的速度,更低的亚阈值摆幅,从而更有效地抑制短通道效应。极低的OFF电流是由于GaN沟道层的体传导,可以完全耗尽。比较了体氮化镓FinFET和传统FinFET (si基)的各种电学参数。采用金属栅极和高钾氧化物(HfO2)作为栅极氧化层来设计FinFET。所提出的高k SOI GaN FinFET已经成为一个非常可行的选择,因为它以高性能和高速集成电路而闻名;由于使用高迁移率GaN鳍代替传统器件中使用的硅鳍,因此也适用于高频和高功率应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High-k SOI GaN FinFET for High Power and High Frequency Applications
This paper proposes a 3-D simulation study of high-k SOI GaN FinFET. High ON current, faster- speed, lower subthreshold swing is obtained thus suppressing the short channel effects more effectively. Extremely low OFF current is obtained due to bulk conduction in the GaN channel layer, which can be fully depleted. Various electrical parameters obtained are compared with Bulk GaN FinFET and Conventional FinFET (Si-based). Proposed FinFET is designed by using a metal gate and high-K oxide (HfO2) is used as the gate oxide layer. The proposed High-k SOI GaN FinFET has come out as a very viable option because it is known for high performance and high-speed integrated circuits; and also for high frequency and high power applications due to using high mobility GaN fin instead of silicon fin used in conventional devices.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信