Sujan Kumar Gonugondla, Ameya D. Patil, Naresh R Shanbhag
{"title":"刷卡","authors":"Sujan Kumar Gonugondla, Ameya D. Patil, Naresh R Shanbhag","doi":"10.1145/3400302.3415642","DOIUrl":null,"url":null,"abstract":"Crossbar-based in-memory architectures have emerged as an attractive platform for energy-efficient realization of deep neural networks (DNNs). A key challenge in such architectures is achieving accurate and efficient writes due to the presence of bitcell conductance variations. In this paper, we propose the Single-Write In-memory Program-vErify (SWIPE) method that achieves high accuracy writes for crossbar-based in-memory architectures at 5×-to-10× lower cost than standard program-verify methods. SWIPE leverages the bit-sliced attribute of crossbar-based in-memory architectures and the statistics of conductance variations to compensate for device non-idealities. Using SWIPE to write into ReRAM crossbar allows for a 2× (CIFAR-10) and 3× (MNIST) increase in storage density with < 1% loss in DNN accuracy. In particular, SWIPE compensates for 4.8×-to-7.7× higher conductance variations. Furthermore, SWIPE can be augmented with injection-based training methods in order to achieve even greater enhancements in robustness.","PeriodicalId":367868,"journal":{"name":"Proceedings of the 39th International Conference on Computer-Aided Design","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"SWIPE\",\"authors\":\"Sujan Kumar Gonugondla, Ameya D. Patil, Naresh R Shanbhag\",\"doi\":\"10.1145/3400302.3415642\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Crossbar-based in-memory architectures have emerged as an attractive platform for energy-efficient realization of deep neural networks (DNNs). A key challenge in such architectures is achieving accurate and efficient writes due to the presence of bitcell conductance variations. In this paper, we propose the Single-Write In-memory Program-vErify (SWIPE) method that achieves high accuracy writes for crossbar-based in-memory architectures at 5×-to-10× lower cost than standard program-verify methods. SWIPE leverages the bit-sliced attribute of crossbar-based in-memory architectures and the statistics of conductance variations to compensate for device non-idealities. Using SWIPE to write into ReRAM crossbar allows for a 2× (CIFAR-10) and 3× (MNIST) increase in storage density with < 1% loss in DNN accuracy. In particular, SWIPE compensates for 4.8×-to-7.7× higher conductance variations. Furthermore, SWIPE can be augmented with injection-based training methods in order to achieve even greater enhancements in robustness.\",\"PeriodicalId\":367868,\"journal\":{\"name\":\"Proceedings of the 39th International Conference on Computer-Aided Design\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-11-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 39th International Conference on Computer-Aided Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/3400302.3415642\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 39th International Conference on Computer-Aided Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3400302.3415642","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Crossbar-based in-memory architectures have emerged as an attractive platform for energy-efficient realization of deep neural networks (DNNs). A key challenge in such architectures is achieving accurate and efficient writes due to the presence of bitcell conductance variations. In this paper, we propose the Single-Write In-memory Program-vErify (SWIPE) method that achieves high accuracy writes for crossbar-based in-memory architectures at 5×-to-10× lower cost than standard program-verify methods. SWIPE leverages the bit-sliced attribute of crossbar-based in-memory architectures and the statistics of conductance variations to compensate for device non-idealities. Using SWIPE to write into ReRAM crossbar allows for a 2× (CIFAR-10) and 3× (MNIST) increase in storage density with < 1% loss in DNN accuracy. In particular, SWIPE compensates for 4.8×-to-7.7× higher conductance variations. Furthermore, SWIPE can be augmented with injection-based training methods in order to achieve even greater enhancements in robustness.