{"title":"VLSI自检电路与系统的设计与合成","authors":"N. Jha, Sying-Jyan Wang","doi":"10.1109/ICCD.1991.139977","DOIUrl":null,"url":null,"abstract":"Self-checking circuits and systems can detect the presence of both transient and permanent faults. The advantage of such a system is that errors can be caught as soon as they occur, and thus data contamination is prevented. Although much effort has been concentrated on the design of self-checking checkers by previous researchers, very few results have been presented for the design of self-checking functional circuits, and fewer still for the design of self-checking systems. Methods are explored for the cost-effective design of combinational and sequential functional circuits, checkers and systems.<<ETX>>","PeriodicalId":239827,"journal":{"name":"[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":"{\"title\":\"Design and synthesis of self-checking VLSI circuits and systems\",\"authors\":\"N. Jha, Sying-Jyan Wang\",\"doi\":\"10.1109/ICCD.1991.139977\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Self-checking circuits and systems can detect the presence of both transient and permanent faults. The advantage of such a system is that errors can be caught as soon as they occur, and thus data contamination is prevented. Although much effort has been concentrated on the design of self-checking checkers by previous researchers, very few results have been presented for the design of self-checking functional circuits, and fewer still for the design of self-checking systems. Methods are explored for the cost-effective design of combinational and sequential functional circuits, checkers and systems.<<ETX>>\",\"PeriodicalId\":239827,\"journal\":{\"name\":\"[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors\",\"volume\":\"67 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"25\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCD.1991.139977\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.1991.139977","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design and synthesis of self-checking VLSI circuits and systems
Self-checking circuits and systems can detect the presence of both transient and permanent faults. The advantage of such a system is that errors can be caught as soon as they occur, and thus data contamination is prevented. Although much effort has been concentrated on the design of self-checking checkers by previous researchers, very few results have been presented for the design of self-checking functional circuits, and fewer still for the design of self-checking systems. Methods are explored for the cost-effective design of combinational and sequential functional circuits, checkers and systems.<>