{"title":"在77K下用硅CCD多路复用器读出Pb0.80Sn0.20Te探测器阵列","authors":"P. Felix, J. Portmann, M. Moulin","doi":"10.1109/IEDM.1978.189468","DOIUrl":null,"url":null,"abstract":"Presented are some experimental results on the readout of a Pb0.80Sn0.20Te six-detector array at 77 K, coupled in the direct injection mode to a silicon CCD multiplexer. A 65 % typical injection efficiency is measured, in good agreement with the theoretical value, estimated from the dynamic impedance of the detector, and the input MOS transistor's transconductance. The detectors are reverse-biased between 15 and 25 mV, which is consistent with the injection efficiency and the ± 9 mV threshold voltage dispersion of the electrical inputs. The modulation amplitude shows a ± 15 % dispersion. An equivalent detectivity in excess of 2 × 1010W-1cm Hz1/2is measured at a 10 micron wavelength, limited by the noise current in the input MOS transistors.","PeriodicalId":164556,"journal":{"name":"1978 International Electron Devices Meeting","volume":"237 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Readout of a Pb0.80Sn0.20Te detector array at 77K with a silicon CCD multiplexer\",\"authors\":\"P. Felix, J. Portmann, M. Moulin\",\"doi\":\"10.1109/IEDM.1978.189468\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Presented are some experimental results on the readout of a Pb0.80Sn0.20Te six-detector array at 77 K, coupled in the direct injection mode to a silicon CCD multiplexer. A 65 % typical injection efficiency is measured, in good agreement with the theoretical value, estimated from the dynamic impedance of the detector, and the input MOS transistor's transconductance. The detectors are reverse-biased between 15 and 25 mV, which is consistent with the injection efficiency and the ± 9 mV threshold voltage dispersion of the electrical inputs. The modulation amplitude shows a ± 15 % dispersion. An equivalent detectivity in excess of 2 × 1010W-1cm Hz1/2is measured at a 10 micron wavelength, limited by the noise current in the input MOS transistors.\",\"PeriodicalId\":164556,\"journal\":{\"name\":\"1978 International Electron Devices Meeting\",\"volume\":\"237 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1978 International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1978.189468\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1978 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1978.189468","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Readout of a Pb0.80Sn0.20Te detector array at 77K with a silicon CCD multiplexer
Presented are some experimental results on the readout of a Pb0.80Sn0.20Te six-detector array at 77 K, coupled in the direct injection mode to a silicon CCD multiplexer. A 65 % typical injection efficiency is measured, in good agreement with the theoretical value, estimated from the dynamic impedance of the detector, and the input MOS transistor's transconductance. The detectors are reverse-biased between 15 and 25 mV, which is consistent with the injection efficiency and the ± 9 mV threshold voltage dispersion of the electrical inputs. The modulation amplitude shows a ± 15 % dispersion. An equivalent detectivity in excess of 2 × 1010W-1cm Hz1/2is measured at a 10 micron wavelength, limited by the noise current in the input MOS transistors.