在77K下用硅CCD多路复用器读出Pb0.80Sn0.20Te探测器阵列

P. Felix, J. Portmann, M. Moulin
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引用次数: 1

摘要

本文给出了在77 K下以直接注入方式耦合到硅CCD多路复用器的Pb0.80Sn0.20Te六探测器阵列的一些实验结果。根据检测器的动态阻抗和输入MOS晶体管的跨导,测量了65%的典型注入效率,与理论值吻合得很好。检测器的反向偏置在15 ~ 25 mV之间,这与注入效率和电输入的±9 mV阈值电压色散一致。调制幅值为±15%色散。在10微米波长处,受输入MOS晶体管噪声电流的限制,测得的等效探测率超过2 × 1010W-1cm hz1 /2。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Readout of a Pb0.80Sn0.20Te detector array at 77K with a silicon CCD multiplexer
Presented are some experimental results on the readout of a Pb0.80Sn0.20Te six-detector array at 77 K, coupled in the direct injection mode to a silicon CCD multiplexer. A 65 % typical injection efficiency is measured, in good agreement with the theoretical value, estimated from the dynamic impedance of the detector, and the input MOS transistor's transconductance. The detectors are reverse-biased between 15 and 25 mV, which is consistent with the injection efficiency and the ± 9 mV threshold voltage dispersion of the electrical inputs. The modulation amplitude shows a ± 15 % dispersion. An equivalent detectivity in excess of 2 × 1010W-1cm Hz1/2is measured at a 10 micron wavelength, limited by the noise current in the input MOS transistors.
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