基于纳米晶粉末薄膜压电膜的压电压力传感器的设计、建模与优化

V. Mohammadi, M. Sheikhi, S. Torkian, A. Barzegar, Ehsan Masumi, S. Mohammadi
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引用次数: 9

摘要

本文首先制备了0-3陶瓷/陶瓷复合锆钛酸铅、Pb(Zr0.52Ti0.48)O3薄膜,然后设计、建模和优化了含锆钛酸铅纳米晶粉末的多层薄膜PZT膜片压力传感器。这种多层隔膜通常用作传感器或执行器。采用ANSYS软件对膜片进行了仿真。对该多层隔膜的动力学特性进行了研究。通过仿真,优化了多层PZT膜片在不同压力范围内提高压力传感器性能的有效参数。本文给出了PZT膜与SiO2的最佳厚度比,以获得多层薄膜PZT膜的最大挠度。以0-3陶瓷/陶瓷复合材料锆钛酸铅、Pb(Zr0.52Ti0.48)O3为材料,采用溶胶-凝胶混合法制备压力传感器。采用溶胶-凝胶法制备PZT纳米粉体,通过磨粒机均匀分散在PZT前驱体溶液中。以2-甲氧基乙醇为溶剂,乙酰丙酮(acac)为螯合剂制备前驱体。复合溶液经自旋镀膜、380℃热解、650℃退火30分钟后沉积在镀铂硅上。XRD分析表明,由于大量陶瓷纳米粉的存在,会形成钙钛矿结构。这种织构对钙钛矿结构的压电性能有很好的影响。薄膜形成牢固的粘合网络,收缩少,因此在加工过程中膜不开裂。通过这个过程,纵横比也会增加。SEM显微图表明,PZT薄膜均匀、无裂纹,具有复合显微结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design, modeling and optimization of a piezoelectric pressure sensor based on thin-film PZT diaphragm contain of nanocrystalline powders
In this paper fabrication of a 0–3 ceramic/ceramic composite lead zirconate titanate, Pb(Zr0.52Ti0.48)O3 thin film has been presented and then a pressure sensor based on multilayer thin-film PZT diaphragm contain of Lead Zirconate Titanate nanocrystalline powders was designed, modeled and optimized. This multilayer diaphragm in general acts as sensor or actuator. ANSYS was used for simulation of diaphragm. Dynamics characteristics of this multilayer diaphragm have been investigated. By this simulation the effective parameters of the multilayer PZT diaphragm for improving the performance of a pressure sensor in different ranges of pressure are optimized. The optimized thickness ratio of PZT layer to SiO2 was given in the paper to obtain the maximum deflection of the multilayer thin-film PZT diaphragm. A 0–3 ceramic/ceramic composite lead zirconate titanate, Pb(Zr0.52Ti0.48)O3 film has been developed to fabricate the pressure sensor by a hybrid sol gel process. PZT nanopowders fabricated via conventional sol gel method and uniformly dispersed in PZT precursor solution by an attrition mill. Preparing of precursor started from 2-methoxyethanol as a solvent and acetylacetone (acac) as a chelating agent. The resulting composite solution deposited onto platinized silicon by spin coating, pyrolysis at 380°C and annealed at 650°C for 30 minutes, respectively. XRD analysis shows that perovskite structure would be formed due to the presence of a significant amount of ceramic nanopowders. This texture has a good effect on piezoelectric properties of perovskite structure. The film forms a strongly bonded network and less shrinkage occurs, so the films do not crack during process. Also the aspect ratio through this process would be increased. SEM micrographs indicated that PZT films were uniform, crack free and have a composite microstructure.
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