发布求助
文献互助 智能选刊 最新文献

TPS7H4010-SEP降压变换器的辐射评估

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI:10.1109/REDW56037.2022.9921486
T. Lew, A. Mariñelarena, J. Cruz-Colon, N. Cunningham
{"title":"TPS7H4010-SEP降压变换器的辐射评估","authors":"T. Lew, A. Mariñelarena, J. Cruz-Colon, N. Cunningham","doi":"10.1109/REDW56037.2022.9921486","DOIUrl":null,"url":null,"abstract":"Single Events Effect (SEE) characterization results for TPS7H4010-SEP Step-Down Converter is summarized, showing very robust SEE performance up to LET<inf>EFF</inf> = 43 MeV-cm<sup>2</sup>/mg.","PeriodicalId":202271,"journal":{"name":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Radiation Evaluation of the TPS7H4010-SEP Step-Down Voltage Converter\",\"authors\":\"T. Lew, A. Mariñelarena, J. Cruz-Colon, N. Cunningham\",\"doi\":\"10.1109/REDW56037.2022.9921486\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Single Events Effect (SEE) characterization results for TPS7H4010-SEP Step-Down Converter is summarized, showing very robust SEE performance up to LET<inf>EFF</inf> = 43 MeV-cm<sup>2</sup>/mg.\",\"PeriodicalId\":202271,\"journal\":{\"name\":\"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)\",\"volume\":\"74 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW56037.2022.9921486\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW56037.2022.9921486","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

总结了TPS7H4010-SEP降压转换器的单事件效应(SEE)表征结果，显示出非常稳健的SEE性能，高达LETEFF = 43 MeV-cm2/mg。
本文章由计算机程序翻译，如有差异，请以英文原文为准。
分享
查看原文 本刊更多论文
Radiation Evaluation of the TPS7H4010-SEP Step-Down Voltage Converter
Single Events Effect (SEE) characterization results for TPS7H4010-SEP Step-Down Converter is summarized, showing very robust SEE performance up to LETEFF = 43 MeV-cm2/mg.
求助全文
通过发布文献求助，成功后即可免费获取论文全文。 去求助
来源期刊
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信