先进半导体工厂的CIM系统

K. Shibata
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引用次数: 1

摘要

描述了先进半导体工厂中CIM系统开发和交付的策略,建立了一种高效生产各种设备的方法。CIM系统的实施有望提高工艺和设备工程技术、晶圆制造技术和设备效率的总生产率。已经开发了一个调度员,目前正在使用生产线数据评估在制品批次移动的性能。介绍了生产线分析工具,并成功地应用于定量分析。开发了一个统计精细控制系统(SFINCS),用于对以下批次进行工艺参数优化。提出了一种故障位判别专家系统。实现了故障位数据的详细、准确、快速的模式识别。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
CIM Systems In An Advanced Semiconductor Factory
The policies of CIM systems development and delivery in an advanced semiconductor factory are described, establishing a methodology for efficient production of a variety of devices. The implementation of CIM systems is expected to enhance total productivity in process and device engineering technology, wafer fabrication technology, and equipment efficiency. A dispatcher has been developed, and is presently evaluating the performance of WIP lot movements using production-line data. Production-line analysis tools are introduced and successfully utilized in quantitative analysis. A statistical fine control system (SFINCS) is developed to carry out process parameter optimization for the following lot. An expert system for fail-bit discrimination is developed. Detailed, accurate, and rapid pattern discrimination of fail-bit data is achieved.
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