{"title":"力测量功能在教育AFM中的实现","authors":"S. Loh, K. Yeap, Jun Yan Lim, J. Sim","doi":"10.1109/ICCSCE47578.2019.9068575","DOIUrl":null,"url":null,"abstract":"The LabVIEW-based educational atomic force microscope (AFM) with National Instruments Educational Laboratory Virtual Instrumentation Suite (NI ELVIS) as the controller platform was built previously. However, it has limited function. Modification is needed to enhance the graphical user interface (GUI) so that more advanced features can be integrated into the existing platform. In this study, the force measurement function is introduced into the existing AFM system. Other additional features such as calibration of the cantilever spring constant and data storage are integrated into the system as well.","PeriodicalId":221890,"journal":{"name":"2019 9th IEEE International Conference on Control System, Computing and Engineering (ICCSCE)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Implementation of the Force Measurement Feature in the Educational AFM\",\"authors\":\"S. Loh, K. Yeap, Jun Yan Lim, J. Sim\",\"doi\":\"10.1109/ICCSCE47578.2019.9068575\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The LabVIEW-based educational atomic force microscope (AFM) with National Instruments Educational Laboratory Virtual Instrumentation Suite (NI ELVIS) as the controller platform was built previously. However, it has limited function. Modification is needed to enhance the graphical user interface (GUI) so that more advanced features can be integrated into the existing platform. In this study, the force measurement function is introduced into the existing AFM system. Other additional features such as calibration of the cantilever spring constant and data storage are integrated into the system as well.\",\"PeriodicalId\":221890,\"journal\":{\"name\":\"2019 9th IEEE International Conference on Control System, Computing and Engineering (ICCSCE)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 9th IEEE International Conference on Control System, Computing and Engineering (ICCSCE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCSCE47578.2019.9068575\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 9th IEEE International Conference on Control System, Computing and Engineering (ICCSCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCSCE47578.2019.9068575","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Implementation of the Force Measurement Feature in the Educational AFM
The LabVIEW-based educational atomic force microscope (AFM) with National Instruments Educational Laboratory Virtual Instrumentation Suite (NI ELVIS) as the controller platform was built previously. However, it has limited function. Modification is needed to enhance the graphical user interface (GUI) so that more advanced features can be integrated into the existing platform. In this study, the force measurement function is introduced into the existing AFM system. Other additional features such as calibration of the cantilever spring constant and data storage are integrated into the system as well.