{"title":"基于单元组合的MFL信号任意缺陷重构方法","authors":"Lisha Peng, Songling Huang, Shen Wang, Wei Zhao","doi":"10.1109/I2MTC43012.2020.9128671","DOIUrl":null,"url":null,"abstract":"A solution to the inverse problem of reconstructing the defect from a detected Magnetic flux leakage (MFL) signal is important in MFL testing. This paper proposes an element-combination method to solve the inverse problem efficiently. This method obtains sets of element MFL signals of different defects from a finite element model in advance. By conducting the interpolation and combination operations of the selected element signals based on the deduced combination-invariance property, the defect profile is updated to approach the optimal result. The presented inverse procedure is tested using arbitrary defects, and the results show a good agreement between the target and reconstructed defect profiles with a high calculation speed.","PeriodicalId":227967,"journal":{"name":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","volume":"103 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"An Element-Combination Method for Arbitrary Defect Reconstruction from MFL Signals\",\"authors\":\"Lisha Peng, Songling Huang, Shen Wang, Wei Zhao\",\"doi\":\"10.1109/I2MTC43012.2020.9128671\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A solution to the inverse problem of reconstructing the defect from a detected Magnetic flux leakage (MFL) signal is important in MFL testing. This paper proposes an element-combination method to solve the inverse problem efficiently. This method obtains sets of element MFL signals of different defects from a finite element model in advance. By conducting the interpolation and combination operations of the selected element signals based on the deduced combination-invariance property, the defect profile is updated to approach the optimal result. The presented inverse procedure is tested using arbitrary defects, and the results show a good agreement between the target and reconstructed defect profiles with a high calculation speed.\",\"PeriodicalId\":227967,\"journal\":{\"name\":\"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)\",\"volume\":\"103 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/I2MTC43012.2020.9128671\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/I2MTC43012.2020.9128671","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Element-Combination Method for Arbitrary Defect Reconstruction from MFL Signals
A solution to the inverse problem of reconstructing the defect from a detected Magnetic flux leakage (MFL) signal is important in MFL testing. This paper proposes an element-combination method to solve the inverse problem efficiently. This method obtains sets of element MFL signals of different defects from a finite element model in advance. By conducting the interpolation and combination operations of the selected element signals based on the deduced combination-invariance property, the defect profile is updated to approach the optimal result. The presented inverse procedure is tested using arbitrary defects, and the results show a good agreement between the target and reconstructed defect profiles with a high calculation speed.