故障安全CMOS逻辑电路的设计

[1991] Proceedings. First Great Lakes Symposium on VLSI Pub Date : 1991-03-01 DOI:10.1109/GLSV.1991.143993

V. Bobin, S. Whitaker

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引用次数: 2

摘要

报道了使CMOS逻辑电路失效安全的设计技术。将晶体管卡通和卡开故障、信号线卡通故障和桥接故障分为两类故障。为类中的多个故障维护故障安全属性。作为副产品引入了有限的容错能力。

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Design of fail-safe CMOS logic circuits

Design techniques to make CMOS logic circuits fail-safe are reported. The set of transistor stuck-on and stuck-open faults, signal lines stuck-at faults, and bridging faults is partitioned into two classes of faults. Fail-safe property is maintained for multiple faults within a class. Limited fault tolerance capability is introduced as a by-product.<>

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[1991] Proceedings. First Great Lakes Symposium on VLSI

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