Sheng Dai, Yuejun Zhang, Huihong Zhang, Jing Li, Ye Lin
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引用次数: 0
摘要
为了解决SRAM的掉电信息丢失问题,非易失性电路越来越受到人们的关注。但非易失性电路存在存储时间长、功耗高等问题。本文提出了一种利用ReRAM实现10T2R非易失SRAM的方案。8T SRAM具有高静态噪声裕度(SNM)。rram的加入为设备提供了断电后保持数据和上电后恢复数据的能力。其次,非易失性存储器的2T2R结构采用记忆分压器(Memristive Voltage Divider, MVD)布置,既节省了电路面积,又降低了写入能量。最后,在65nm CMOS技术下,对基于rram的10T2R SRAM的功能和性能进行了验证和评估。实验结果表明,该非易失性SRAM电路具有掉电恢复功能,恢复延时为9ns。当ReRAM R-ratio =10和20时,所提电路的恢复率均达到100%。
A ReRAM-based 10T2R SRAM Using Power-off Recovery Function for Reducing Power
To solve the problem of power-off information loss of SRAM, non-volatile circuits are attracting more and more attention. However, there are some problems in the non-volatile circuit, such as long storage time and high-power consumption. In this paper, a scheme of 10T2R non-volatile SRAM use ReRAM is proposed. The 8T SRAM is selected for the high static noise margin (SNM). The addition of ReRAM provides the device with the ability to keep data after power-off and recover data after power-on. Then, the 2T2R structure of non-volatile memory uses a Memristive Voltage Divider (MVD) arrangement, not only saves the circuit area but also reduces the write energy. Finally, the functionality and performance of the ReRAM-based 10T2R SRAM are validated and evaluated in 65nm CMOS technology. The experimental results show that the non-volatile SRAM circuit has the power-off recovery function, and the restore latency needs 9ns. The restore yield of proposed circuit all achieve 100% when ReRAM R-ratio =10 and 20.