{"title":"时间/温度诱导太阳能电池退化的双二极管建模","authors":"P. Junsangsri, F. Lombardi","doi":"10.1109/MWSCAS.2010.5548809","DOIUrl":null,"url":null,"abstract":"This paper presents a simulation-based analysis of degradation of a solar cell as induced by temperature and/or time. Based on the double diode model (DDM) and using HSPICE, relationships are found between the parameters of the equivalent electrical circuit and efficiency, process variations and optimization in its operation. The results of this paper show that time, temperature and irradiance are of significance in DDM, because they affect the efficiency of a solar cell when degradation occurs.","PeriodicalId":245322,"journal":{"name":"2010 53rd IEEE International Midwest Symposium on Circuits and Systems","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Double diode modeling of time/temperature induced degradation of solar cells\",\"authors\":\"P. Junsangsri, F. Lombardi\",\"doi\":\"10.1109/MWSCAS.2010.5548809\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a simulation-based analysis of degradation of a solar cell as induced by temperature and/or time. Based on the double diode model (DDM) and using HSPICE, relationships are found between the parameters of the equivalent electrical circuit and efficiency, process variations and optimization in its operation. The results of this paper show that time, temperature and irradiance are of significance in DDM, because they affect the efficiency of a solar cell when degradation occurs.\",\"PeriodicalId\":245322,\"journal\":{\"name\":\"2010 53rd IEEE International Midwest Symposium on Circuits and Systems\",\"volume\":\"49 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-08-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 53rd IEEE International Midwest Symposium on Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS.2010.5548809\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 53rd IEEE International Midwest Symposium on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2010.5548809","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Double diode modeling of time/temperature induced degradation of solar cells
This paper presents a simulation-based analysis of degradation of a solar cell as induced by temperature and/or time. Based on the double diode model (DDM) and using HSPICE, relationships are found between the parameters of the equivalent electrical circuit and efficiency, process variations and optimization in its operation. The results of this paper show that time, temperature and irradiance are of significance in DDM, because they affect the efficiency of a solar cell when degradation occurs.
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