基于180nm CMOS技术的σ = 0.66 LSB 8位变分辨率时数转换器

Jonathan Santiago-Fernandez, A. Díaz-Sánchez, J. M. Rocha-Pérez, V. H. Carbajal-Gómez, G. Zamora-Mejía
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引用次数: 0

摘要

本文提出了一种适用于延时测量应用的8位时间-数字转换器(TDC)。所提出的TDC由两个嵌套的4位计数器、一个数字逻辑控制网络、一个寄存器和一个解码器组成。采用Verilog语言,利用该技术的标准细胞合成TDC。该系统具有标准数字输出,由1.8 V电源供电,总功耗为9.86 mW。利用台积电180纳米CMOS技术,通过布局后模拟进行了表征。该结构的面积为355.4 μm × 105.8 μm。此外,该TDC具有0.66 LSB的标准偏差,具有固定的输入时间间隔,用户选择的工作频率从1 MHz到1 GHz。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A σ = 0.66 LSB 8-bit Time-to-Digital Converter with Variable Resolution in a 180nm CMOS Technology
This work presents an 8-bit Time-to-Digital Converter (TDC) suitable for time-lapse measurement applications. The proposed TDC is composed of two nested 4-bit counters, a digital-logic control network, a register, and a decoder. Verilog language was used to synthesize the TDC using the standard cells of the technology. The system has a standard digital output and it is powered by a 1.8 V supply with a total power consumption of 9.86 mW. The characterization was performed by means of post-layout simulations using a TSMC 180 nm CMOS technology. The proposed structure exhibits a 355.4 μm × 105.8 μm area. In addition, this TDC has a standard deviation of 0.66 LSB with a fixed input time interval with a user-select operation frequency from 1 MHz to 1 GHz.
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