200°C至-100°C时量子效应对GAA纳米片NMOS的影响

João V. C. Leal, P. Agopian, J. Martino
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引用次数: 0

摘要

本文研究了栅极纳米片(GAA NS) NMOS器件在200°C至-100°C温度下的量子效应。从200°C到室温使用不同通道长度(低至28 nm)的实验结果,并使用校准的TCAD模拟来推断低至-100°C的行为。量子约束存在于所有器件中,但只有在h = 5nm的情况下,它对阈值电压增加的贡献更相关。随着温度的升高,这个增量是恒定的,但在这种情况下,由于VT降低,它在更高的温度下变得更重要。亚阈值摆幅不受量子模型的影响,在所有情况下其值都接近于(kT/q)ln(10),在器件高度最低时得到的结果最好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Influence of the Quantum Effect on the GAA Nanosheet NMOS from 200°C down to -100°C
The quantum effect on the Gate-All-Around Nanosheet (GAA NS) NMOS devices are studied in this paper from 200°C down to -100°C. The experimental results for different channel lengths (down to 28 nm) are used from 200°C to room temperature and the behavior down to -100°C is extrapolated using calibrated TCAD simulation. The quantum confinement is present in all devices, but only for the h = 5nm case its contribution for the threshold voltage increase is more relevant. This increment is constant with the temperature, but it becomes proportionally more important for higher temperatures due to the VT decrease in such conditions. The subthreshold swing is not affected by the quantum model and its value is close to (kT/q)ln(10) in all cases, with the best results obtained for the lowest device height.
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