硅技术中的衬底耦合噪声问题

K. Jenkins
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引用次数: 24

摘要

几个因素结合在一起,增加了对硅集成电路中衬底耦合噪声或串扰的关注:半导体产品中模拟和混合信号电路的使用越来越多,集成密度越来越大,电路频率也在稳步增加。虽然人们已经很好地理解了通过半导体衬底传导电信号的基本原理,但对衬底耦合噪声的实际方面的理解仍然相对较差:衬底串扰在实际应用中有多重要?减少串扰的设计准则有多好,或者精确的基板建模和仿真工具是必要的吗?可以使用哪些技术特性来减少耦合?本文综述了在回答这些问题方面的进展。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Substrate coupling noise issues in silicon technology
Several factors are combining to increase concern about substrate coupling noise, or crosstalk, in silicon integrated circuits: there is a growing use of analog and mixed signal circuits in semiconductor products, there is greater integration density, and circuit frequencies are steadily increasing. Although the basic principles of electrical signal conduction through a semiconducting substrate are well understood, there is still a relatively poor understanding of the practical aspects of substrate-coupled noise: how important is substrate crosstalk in real applications? How good are the design guidelines for reducing crosstalk, or are accurate substrate modeling and simulation tools a necessity? What technology features can be used to reduce the coupling? This paper reviews progress in answering these questions.
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