Zhengpeng Wang, H. Gong, Xinxin Yu, F. Ren, S. Gu, Youdou Zheng, Rong Zhang, Jiandong Ye
{"title":"5 A/1.17 kV NiO/$\\beta$-Ga2O3异质结功率整流器,高温工作能力高达548 K","authors":"Zhengpeng Wang, H. Gong, Xinxin Yu, F. Ren, S. Gu, Youdou Zheng, Rong Zhang, Jiandong Ye","doi":"10.1109/ISPSD57135.2023.10147400","DOIUrl":null,"url":null,"abstract":"Industrial power devices are required to conduct at least several amperes current in the on-state while blocking at least hundreds of volts in the off-state. In this work, high-temperature operational $\\text{NiO}/\\beta-\\text{Ga}_{2}\\mathrm{O}_{3}$ vertical p-n heterojunction diodes (HJDs) with ampere-level forward current and kV -level reverse breakdown voltage $(V_{b})$ have been demonstrated. The temperature-dependent current-voltage characteristics reveal that trap-assisted tunneling (TAT) current dominates the forward conduction mechanism of HJDs, while the leakage current is dominated by variable range hopping (VRH) mechanism under the high reverse bias. The resultant large-area (1×1 mm2) HJD rectifiers exhibit a superior forward on-state current of 5 A, a nearly-unity ideality factor and a large $V_{b}$ of 1.17 kV operated at a high temperature up to 548 K. The low deterioration rate of forward on-state current (1.24 mA/K at 4 V) and $V_{b}$ (0.95 V/K) with temperature implies high reliability of HJD, evidencing the promising potential of Ga2O3-based power diodes in harsh-environment power systems.","PeriodicalId":344266,"journal":{"name":"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"5 A/1.17 kV NiO/$\\\\beta$-Ga2O3 heterojunction power rectifier with high-temperature operation capability up to 548 K\",\"authors\":\"Zhengpeng Wang, H. Gong, Xinxin Yu, F. Ren, S. Gu, Youdou Zheng, Rong Zhang, Jiandong Ye\",\"doi\":\"10.1109/ISPSD57135.2023.10147400\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Industrial power devices are required to conduct at least several amperes current in the on-state while blocking at least hundreds of volts in the off-state. In this work, high-temperature operational $\\\\text{NiO}/\\\\beta-\\\\text{Ga}_{2}\\\\mathrm{O}_{3}$ vertical p-n heterojunction diodes (HJDs) with ampere-level forward current and kV -level reverse breakdown voltage $(V_{b})$ have been demonstrated. The temperature-dependent current-voltage characteristics reveal that trap-assisted tunneling (TAT) current dominates the forward conduction mechanism of HJDs, while the leakage current is dominated by variable range hopping (VRH) mechanism under the high reverse bias. The resultant large-area (1×1 mm2) HJD rectifiers exhibit a superior forward on-state current of 5 A, a nearly-unity ideality factor and a large $V_{b}$ of 1.17 kV operated at a high temperature up to 548 K. The low deterioration rate of forward on-state current (1.24 mA/K at 4 V) and $V_{b}$ (0.95 V/K) with temperature implies high reliability of HJD, evidencing the promising potential of Ga2O3-based power diodes in harsh-environment power systems.\",\"PeriodicalId\":344266,\"journal\":{\"name\":\"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)\",\"volume\":\"87 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD57135.2023.10147400\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD57135.2023.10147400","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
5 A/1.17 kV NiO/$\beta$-Ga2O3 heterojunction power rectifier with high-temperature operation capability up to 548 K
Industrial power devices are required to conduct at least several amperes current in the on-state while blocking at least hundreds of volts in the off-state. In this work, high-temperature operational $\text{NiO}/\beta-\text{Ga}_{2}\mathrm{O}_{3}$ vertical p-n heterojunction diodes (HJDs) with ampere-level forward current and kV -level reverse breakdown voltage $(V_{b})$ have been demonstrated. The temperature-dependent current-voltage characteristics reveal that trap-assisted tunneling (TAT) current dominates the forward conduction mechanism of HJDs, while the leakage current is dominated by variable range hopping (VRH) mechanism under the high reverse bias. The resultant large-area (1×1 mm2) HJD rectifiers exhibit a superior forward on-state current of 5 A, a nearly-unity ideality factor and a large $V_{b}$ of 1.17 kV operated at a high temperature up to 548 K. The low deterioration rate of forward on-state current (1.24 mA/K at 4 V) and $V_{b}$ (0.95 V/K) with temperature implies high reliability of HJD, evidencing the promising potential of Ga2O3-based power diodes in harsh-environment power systems.