{"title":"用于大型逻辑卡和LSI的诊断系统","authors":"Susumu Goshima, Yuichi Oka, T. Kozawa, Teruo Mori, Yoshimitsu Takeguchi, Yasuhiro Ohno","doi":"10.1109/DAC.1981.1585360","DOIUrl":null,"url":null,"abstract":"We have developed the diagnostic system, consisting of highly automated test generator, fast fault simulator and automatic fault locator. Several techniques, employed in the system, are as follows: 9-value D-Algorithm for sequential circuits., 6-value concurrent fault simulator., Functional Modeling of RAM'S, ROM'S, counters, and etc., Iterative processing of generator and simulator. This system has contributed to testing cards, and LSI'S used in Hitachi computer M-200H and others.","PeriodicalId":201443,"journal":{"name":"18th Design Automation Conference","volume":"02 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1981-06-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Diagnostic System for Large Scale Logic Cards and LSI'S\",\"authors\":\"Susumu Goshima, Yuichi Oka, T. Kozawa, Teruo Mori, Yoshimitsu Takeguchi, Yasuhiro Ohno\",\"doi\":\"10.1109/DAC.1981.1585360\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have developed the diagnostic system, consisting of highly automated test generator, fast fault simulator and automatic fault locator. Several techniques, employed in the system, are as follows: 9-value D-Algorithm for sequential circuits., 6-value concurrent fault simulator., Functional Modeling of RAM'S, ROM'S, counters, and etc., Iterative processing of generator and simulator. This system has contributed to testing cards, and LSI'S used in Hitachi computer M-200H and others.\",\"PeriodicalId\":201443,\"journal\":{\"name\":\"18th Design Automation Conference\",\"volume\":\"02 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1981-06-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"18th Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1981.1585360\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"18th Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1981.1585360","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Diagnostic System for Large Scale Logic Cards and LSI'S
We have developed the diagnostic system, consisting of highly automated test generator, fast fault simulator and automatic fault locator. Several techniques, employed in the system, are as follows: 9-value D-Algorithm for sequential circuits., 6-value concurrent fault simulator., Functional Modeling of RAM'S, ROM'S, counters, and etc., Iterative processing of generator and simulator. This system has contributed to testing cards, and LSI'S used in Hitachi computer M-200H and others.
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