微电子学的近期辐射损伤和单事件效应结果

1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463) Pub Date : 1999-07-12 DOI:10.1109/REDW.1999.816042

M. O’Bryan, K. Label, Robert A. Reed, J. W. Howard, Janet L. Barth, C. Seidleck, P. Marshall, Cheryl J. Marshall, Hak S. Kim, D. Hawkins, M. Carts, Kurt E. Forslund

{"title":"微电子学的近期辐射损伤和单事件效应结果","authors":"M. O’Bryan, K. Label, Robert A. Reed, J. W. Howard, Janet L. Barth, C. Seidleck, P. Marshall, Cheryl J. Marshall, Hak S. Kim, D. Hawkins, M. Carts, Kurt E. Forslund","doi":"10.1109/REDW.1999.816042","DOIUrl":null,"url":null,"abstract":"We present heavy ion and proton single event effects (SEE) as well as radiation damage ground test results for candidate spacecraft electronics. Microelectronics tested include digital, analog, and hybrid devices.","PeriodicalId":447869,"journal":{"name":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","volume":"97 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"29","resultStr":"{\"title\":\"Recent radiation damage and single event effect results for microelectronics\",\"authors\":\"M. O’Bryan, K. Label, Robert A. Reed, J. W. Howard, Janet L. Barth, C. Seidleck, P. Marshall, Cheryl J. Marshall, Hak S. Kim, D. Hawkins, M. Carts, Kurt E. Forslund\",\"doi\":\"10.1109/REDW.1999.816042\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present heavy ion and proton single event effects (SEE) as well as radiation damage ground test results for candidate spacecraft electronics. Microelectronics tested include digital, analog, and hybrid devices.\",\"PeriodicalId\":447869,\"journal\":{\"name\":\"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)\",\"volume\":\"97 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-07-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"29\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.1999.816042\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.1999.816042","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 29

摘要

我们给出了候选航天器电子设备的重离子和质子单事件效应(SEE)以及辐射损伤地面试验结果。微电子测试包括数字，模拟和混合设备。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Recent radiation damage and single event effect results for microelectronics

We present heavy ion and proton single event effects (SEE) as well as radiation damage ground test results for candidate spacecraft electronics. Microelectronics tested include digital, analog, and hybrid devices.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)

自引率

0.00%

发文量