Chen Yixin, Hao Meng, Shao Jingjing, L. Esther, Khoo Bing Sheng, Chooi Meailing, Li Kai, Xing Qiuju, Kon Cambridge, Lee Hwang Sheng, Shen Yiqiang, Song Lu, Xing Zhenxiang, Zhou Yongkai, Feng Yang, Fu Chao, H. Younan, Li Xiaomin
{"title":"ATR-FTIR，双束FIB-SEM, TEM和TOF-SIMS研究了高温和潮湿诱导的触摸板中电极模式的“白雾”","authors":"Chen Yixin, Hao Meng, Shao Jingjing, L. Esther, Khoo Bing Sheng, Chooi Meailing, Li Kai, Xing Qiuju, Kon Cambridge, Lee Hwang Sheng, Shen Yiqiang, Song Lu, Xing Zhenxiang, Zhou Yongkai, Feng Yang, Fu Chao, H. Younan, Li Xiaomin","doi":"10.1109/IPFA.2014.6898153","DOIUrl":null,"url":null,"abstract":"White haze or the so called mura effect has been recognized as a common defect in touch panels. Nevertheless, the underlying mechanism has not been fully understood and clearly investigated. In this study, a comprehensive characterization study using the ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS on the high temperature and moisture induced white haze, which follows the pattern of electrodes in touch panels, is first reported. It is suspected that the white haze is a moisture induced reflection alteration phenomenon of the OCA (optically clear adhesive), while the electrodes related pattern is highly dependent on the local variation in hygroscopic swelling.","PeriodicalId":409316,"journal":{"name":"Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS studies on high temperature and moisture induced “white haze” following the pattern of electrodes in touch panels\",\"authors\":\"Chen Yixin, Hao Meng, Shao Jingjing, L. Esther, Khoo Bing Sheng, Chooi Meailing, Li Kai, Xing Qiuju, Kon Cambridge, Lee Hwang Sheng, Shen Yiqiang, Song Lu, Xing Zhenxiang, Zhou Yongkai, Feng Yang, Fu Chao, H. Younan, Li Xiaomin\",\"doi\":\"10.1109/IPFA.2014.6898153\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"White haze or the so called mura effect has been recognized as a common defect in touch panels. Nevertheless, the underlying mechanism has not been fully understood and clearly investigated. In this study, a comprehensive characterization study using the ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS on the high temperature and moisture induced white haze, which follows the pattern of electrodes in touch panels, is first reported. It is suspected that the white haze is a moisture induced reflection alteration phenomenon of the OCA (optically clear adhesive), while the electrodes related pattern is highly dependent on the local variation in hygroscopic swelling.\",\"PeriodicalId\":409316,\"journal\":{\"name\":\"Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-09-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2014.6898153\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2014.6898153","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS studies on high temperature and moisture induced “white haze” following the pattern of electrodes in touch panels
White haze or the so called mura effect has been recognized as a common defect in touch panels. Nevertheless, the underlying mechanism has not been fully understood and clearly investigated. In this study, a comprehensive characterization study using the ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS on the high temperature and moisture induced white haze, which follows the pattern of electrodes in touch panels, is first reported. It is suspected that the white haze is a moisture induced reflection alteration phenomenon of the OCA (optically clear adhesive), while the electrodes related pattern is highly dependent on the local variation in hygroscopic swelling.
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